Sima C, Gates J C, Rogers H L, Mennea P L, Holmes C, Zervas M N, Smith P G R
Optoelectronics Research Centre, University of Southampton, Southampton, SO17 1BJ, UK.
Opt Express. 2013 Jul 1;21(13):15747-54. doi: 10.1364/OE.21.015747.
A direct UV grating writing technique based on phase-controlled interferometry is proposed and demonstrated in a silica-on-silicon platform, with a wider wavelength detuning range than any previously reported UV writing technology. Electro-optic phase modulation of one beam in the interferometer is used to manipulate the fringe pattern and thus control the parameters of the Bragg gratings and waveguides. Various grating structures with refractive index apodization, phase shifts and index contrasts of up to 0.8 × 10(-3) have been demonstrated. The method offers significant time/energy efficiency as well as simplified optical layout and fabrication process. We have shown Bragg gratings can be made from 1200 nm to 1900 nm exclusively under software control and the maximum peak grating reflectivity only decreases by 3 dBover a 250 nm (~32 THz) bandwidth.
提出了一种基于相位控制干涉测量的直接紫外光栅写入技术,并在硅基二氧化硅平台上进行了演示,其波长失谐范围比以往报道的任何紫外写入技术都更宽。利用干涉仪中一束光的电光相位调制来操纵条纹图案,从而控制布拉格光栅和波导的参数。已经展示了具有折射率切趾、相移和高达0.8×10(-3)的折射率对比度的各种光栅结构。该方法具有显著的时间/能量效率,以及简化的光学布局和制造工艺。我们已经表明,仅在软件控制下,就可以在1200纳米至1900纳米范围内制作布拉格光栅,并且在250纳米(约32太赫兹)带宽内,最大峰值光栅反射率仅下降3分贝。