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电子束辐照选择性生成氢自由基和羟基自由基及其与全氟磺酸离子交换膜的反应性。

Selective formation of hydrogen and hydroxyl radicals by electron beam irradiation and their reactivity with perfluorosulfonated acid ionomer.

机构信息

Department of Chemistry, Simon Fraser University , 8888 University Drive, Burnaby, British Columbia, Canada V5A 1S6.

出版信息

J Am Chem Soc. 2013 Oct 23;135(42):15923-32. doi: 10.1021/ja408032p. Epub 2013 Oct 15.

Abstract

Selective formation and reactivity of hydrogen (H(•)) and hydroxyl (HO(•)) radicals with perfluorinated sulfonated ionomer membrane, Nafion 211, is described. Selective formation of radicals was achieved by electron beam irradiation of aqueous solutions of H2O2 or H2SO4 to form HO(•) and H(•), respectively, and confirmed by ESR spectroscopy using a spin trap. The structure of Nafion 211 after reaction with H(•) or HO(•) was determined using calibrated (19)F magic angle spinning NMR spectroscopy. Soluble residues of degradation were analyzed by liquid and solid-state NMR. NMR and ATR-FTIR spectroscopy, together with determination of ion exchange capacity, water uptake, proton conductivity, and fluoride ion release, strongly indicate that attack by H(•) occurs at the tertiary carbon C-F bond on both the main and side chain; whereas attack by HO(•) occurs solely on the side chain, specifically, the α-O-C bond.

摘要

本文描述了全氟磺酸离子交换膜 Nafion 211 中氢(H(•))和羟基(HO(•))自由基的选择性生成和反应活性。通过电子束辐照 H2O2 或 H2SO4 的水溶液,分别形成 HO(•)和 H(•),实现了自由基的选择性生成,并通过使用自旋捕获剂的 ESR 光谱进行了确认。使用校准的(19)F 魔角旋转 NMR 光谱法确定了与 H(•)或 HO(•)反应后的 Nafion 211 的结构。通过液体和固态 NMR 分析了降解的可溶性残留物。NMR 和 ATR-FTIR 光谱以及离子交换容量、吸水率、质子电导率和氟离子释放的测定强烈表明,H(•)的攻击发生在主链和侧链上的叔 C-F 键上;而 HO(•)的攻击仅发生在侧链上,具体来说,是在 α-O-C 键上。

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