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扩展 X 射线吸收精细结构研究 GaAs 的局域振动特性。

Local vibrational properties of GaAs studied by extended X-ray absorption fine structure.

机构信息

Elettra - Sincrotrone Trieste S.C.p.A., S.S. 14, 34149 Basovizza, Trieste, Italy.

出版信息

J Chem Phys. 2013 Oct 28;139(16):164512. doi: 10.1063/1.4826629.

Abstract

Extended X-ray absorption fine structure (EXAFS) has been measured at both the K edges of gallium and arsenic in GaAs, from 14 to 300 K, to investigate the local vibrational and thermodynamic behaviour in terms of bond expansion, parallel, and perpendicular mean square relative displacements and third cumulant. The separate analysis of the two edges allows a self-consistent check of the results and suggests that a residual influence of Ga EXAFS at the As edge cannot be excluded. The relation between bond expansion, lattice expansion, and expansion due to anharmonicity of the effective potential is quantitatively clarified. The comparison with previous EXAFS results on other crystals with the diamond or zincblende structure shows that the values of a number of parameters determined from EXAFS are clearly correlated with the fractional ionicity and with the strength and temperature interval of the lattice negative expansion.

摘要

扩展 X 射线吸收精细结构(EXAFS)已在 GaAs 中测量了 Ga 和 As 的 K 边,范围从 14 到 300 K,以研究局部振动和热力学行为,包括键扩展、平行和垂直均方根相对位移以及第三累积量。对两个边缘的单独分析允许对结果进行自洽检查,并表明不能排除 Ga EXAFS 在 As 边缘的残余影响。定量澄清了键扩展、晶格扩展以及有效势的非谐性引起的扩展之间的关系。与具有金刚石或闪锌矿结构的其他晶体的先前 EXAFS 结果进行比较表明,从 EXAFS 确定的许多参数的值与部分离子性以及晶格负膨胀的强度和温度间隔明显相关。

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