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乳腺断层合成中测量断层厚度的几何形状效应评估。

Evaluation of the effect of geometry for measuring section thickness in tomosynthesis.

作者信息

Fukui Ryohei, Ishii Rie, Kishimoto Junichi, Yamato Shinichiro, Takahata Akira, Kohama Chiyuki

机构信息

Division of Clinical Radiology, Tottori University Hospital, 36-1 Nishi-cho, Yonago, Tottori, 683-8504, Japan,

出版信息

Radiol Phys Technol. 2014 Jan;7(1):141-7. doi: 10.1007/s12194-013-0243-0. Epub 2013 Nov 20.

Abstract

Our aim in this study was to evaluate the effect of geometry for measuring section thickness in tomosynthesis by using a metal bead device (bead method). Tomosynthesis images were obtained from two types of tomosynthesis equipment, Safire17 (ST, Shimadzu, Kyoto, Japan) and XR650 (GT, GE Healthcare, Milwaukee, WI). After tomosynthesis radiography with each device, the bead tomosynthesis images were obtained by image reconstruction. The digital profile was obtained from the digital value of the bead central coordinate in the perpendicular direction, and we acquired the slice sensitivity profile (SSP). The section thickness was defined with the full width at half maximum obtained from the SSP. We investigated the change in section thickness under different evaluation conditions: the angular range, the height of the bead position, the source-image receptor distance (SID), and image processing. The section thickness decreased when the angular range and height of the bead position increased. Also, the section thickness varied with a change in the SID. The section thickness differed according to the geometry for measuring the section thickness. Thus, the effect of the geometry used for measurement should be considered when the section thickness in tomosynthesis is measured by the bead method.

摘要

本研究的目的是通过使用金属珠装置(珠法)评估在断层合成中测量断层厚度时几何形状的影响。断层合成图像是从两种类型的断层合成设备获得的,即Safire17(ST,日本岛津公司,京都)和XR650(GT,通用电气医疗集团,威斯康星州密尔沃基)。在用每种设备进行断层合成射线照相后,通过图像重建获得珠断层合成图像。从垂直方向上珠中心坐标的数字值获得数字轮廓,并获取切片灵敏度轮廓(SSP)。断层厚度由从SSP获得的半高全宽定义。我们研究了不同评估条件下断层厚度的变化:角度范围、珠位置的高度、源-图像接收器距离(SID)和图像处理。当角度范围和珠位置的高度增加时,断层厚度减小。此外,断层厚度随SID的变化而变化。断层厚度因测量断层厚度的几何形状而异。因此,当通过珠法测量断层合成中的断层厚度时,应考虑用于测量的几何形状的影响。

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