Saito Hikaru, Namura Kyoko, Suzuki Motofumi, Kurata Hiroki
Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011, Japan.
Microscopy (Oxf). 2014 Feb;63(1):85-93. doi: 10.1093/jmicro/dft047. Epub 2013 Nov 27.
The coupled surface plasmon-polariton (SPP) modes excited in an Al/SiO2/Al multilayer structure were analyzed using angle-resolved electron energy-loss spectroscopy (AREELS) with a relativistic electron probe. The dispersion relations for the coupled SPP modes were then directly observed and compared with predicted relations obtained via calculations. Good agreement was noted between the experimental and calculated results. In the multilayer structures, the dispersion relation for the coupled SPP modes was found to be sensitive to the thickness of each film, which could be interpreted qualitatively by the electron energy-loss probability calculated for thin aluminum (Al) films and narrow Al gaps using Kröger's formula. It was demonstrated that significant differences in the excitation probability for SPPs could be observed depending on the coupling modes.
利用相对论电子探针的角分辨电子能量损失谱(AREELS)分析了在Al/SiO2/Al多层结构中激发的耦合表面等离激元-极化激元(SPP)模式。然后直接观察了耦合SPP模式的色散关系,并与通过计算得到的预测关系进行了比较。实验结果与计算结果吻合良好。在多层结构中,发现耦合SPP模式的色散关系对每层薄膜的厚度敏感,这可以用Kröger公式计算的薄铝(Al)薄膜和窄Al间隙的电子能量损失概率进行定性解释。结果表明,根据耦合模式的不同,可以观察到SPP激发概率的显著差异。