Li Beiwen, Karpinsky Nikolaus, Zhang Song
Appl Opt. 2014 Jun 1;53(16):3415-26. doi: 10.1364/AO.53.003415.
A structured-light system with a binary defocusing technique has the potential to have more extensive application due to its high speeds, gamma-calibration-free nature, and lack of rigid synchronization requirements between the camera and projector. However, the existing calibration methods fail to achieve high accuracy for a structured-light system with an out-of-focus projector. This paper proposes a method that can accurately calibrate a structured-light system even when the projector is not in focus, making it possible for high-accuracy and high-speed measurement with the binary defocusing method. Experiments demonstrate that our calibration approach performs consistently under different defocusing degrees, and a root-mean-square error of about 73 μm can be achieved with a calibration volume of 150(H) mm×250(W) mm×200(D)mm.
具有二元散焦技术的结构光系统因其高速度、无需伽马校准以及相机和投影仪之间缺乏严格同步要求而具有更广泛的应用潜力。然而,现有的校准方法无法对投影仪失焦的结构光系统实现高精度校准。本文提出了一种即使投影仪未聚焦也能精确校准结构光系统的方法,从而使得使用二元散焦方法进行高精度和高速测量成为可能。实验表明,我们的校准方法在不同散焦程度下表现一致,对于150(高)毫米×250(宽)毫米×200(深)毫米的校准体积,可实现约73微米的均方根误差。