Zuhlke Craig A, Bruce John, Anderson Troy P, Alexander Dennis R, Parigger Christian G
Electrical Engineering Department, 209N WSEC Link, University of Nebraska, Lincoln, NE 68588 USA.
Appl Spectrosc. 2014;68(9):1021-9. doi: 10.1366/13-07387.
We correlate the focusing dynamics of 50 femtosecond (fs) laser radiation as it interacts with a silicon sample to laser-induced breakdown spectroscopy (LIBS) signal strength. Presented are concentric ring-shaped variations in the electric field in the prefocus region due to lens aberrations and nonsymmetry between the prefocus and post-focus beam profile as a result of continuum generation, occurring around the focus. Experimental results show different signal trends for both atmospheric and vacuum conditions, attributed to the existence of a continuum for the former. Lens aberrations effects on the LIBS signal strength are investigated using a plano-convex spherical lens and an aspherized achromatic lens. High-resolution scanning electron micrographs of the silicon surface after ablation, along with theoretical simulations, reveal the electric field patterns near the focus. The research results contribute to fundamental understanding of the basic physics of ultrashort, femtosecond laser radiation interacting with materials.
我们将50飞秒(fs)激光辐射与硅样品相互作用时的聚焦动力学与激光诱导击穿光谱(LIBS)信号强度相关联。由于透镜像差,预聚焦区域的电场呈现出同心环形变化,并且由于连续谱产生,在焦点周围预聚焦和后聚焦光束轮廓之间存在不对称性。实验结果表明,在大气和真空条件下信号趋势不同,这归因于前者存在连续谱。使用平凸球面透镜和非球面消色差透镜研究了透镜像差对LIBS信号强度的影响。烧蚀后硅表面的高分辨率扫描电子显微照片以及理论模拟揭示了焦点附近的电场模式。研究结果有助于从基础物理学层面理解超短飞秒激光辐射与材料相互作用的基本原理。