Sharan Ashwini, Huh Billy, Narouze Samer, Trentman Terrence, Mogilner Alon, Vaisman Julien, Ordia Joe, Deer Timothy, Venkatesan Lalit, Slavin Konstantin
Thomas Jefferson University Hospital, Philadelphia, PA, USA.
The University of Texas MD Anderson Cancer Center, Houston, TX, USA.
Neuromodulation. 2015 Jun;18(4):305-12; discussion 312. doi: 10.1111/ner.12243. Epub 2014 Oct 14.
In this study, we analyze device- and procedure-related adverse events (AEs) from a recent prospective, multicenter, double-blinded controlled study that utilized peripheral nerve stimulation (PNS) of occipital nerves for management of chronic migraine.
PNS device characteristics (lead length and spacing), surgical techniques including lead orientation (parallel or perpendicular to the nerve), and implantable pulse generator (IPG) placement (upper buttock, abdomen, infraclavicular, or lower axilla) in 157 patients were analyzed to identify any relationship with the AE incidence rate. Number of prior PNS implants performed (NPPIP) by the implanter and its relationship with different AE categories (hardware-related, biological, and stimulation-related events) and frequently observed device/procedure-related AEs (lead migration/fracture/breakage, persistent pain at the lead/IPG location, unintended/undesirable changes in stimulation, infection) were also evaluated. Three-way ANOVA tests were utilized to evaluate the dependence of AE occurrence on the variables described above.
IPG pocket locations closer to the lead (e.g. infraclavicular region) were associated with a lower AE incidence rate (p < 0.05). Higher NPPIP was related to lower stimulation- and hardware-related AEs (p < 0.05), frequently observed AEs like lead migration, pain, and infection (p < 0.05), and procedure-related additional surgeries (p < 0.05).
Implantation of the IPG closer to the lead location was associated with reduced AEs. PNS is a relatively new procedure, and the skill and precision in performing these procedures improves with experience. Our results demonstrate that as the implanter gains more experience with these procedures, a significant reduction in device- and procedure-related AEs may be expected.
在本研究中,我们分析了一项近期的前瞻性、多中心、双盲对照研究中与设备和操作相关的不良事件(AE),该研究利用枕神经周围神经刺激(PNS)来治疗慢性偏头痛。
分析了157例患者的PNS设备特征(导线长度和间距)、手术技术,包括导线方向(与神经平行或垂直)以及植入式脉冲发生器(IPG)的放置位置(上臀部、腹部、锁骨下或腋下),以确定其与AE发生率的任何关系。还评估了植入者进行的既往PNS植入次数(NPPIP)及其与不同AE类别(硬件相关、生物学相关和刺激相关事件)以及常见的与设备/操作相关的AE(导线移位/断裂/破损、导线/IPG位置持续疼痛、刺激意外/不良变化、感染)的关系。采用三因素方差分析来评估AE发生与上述变量的相关性。
IPG囊袋位置更靠近导线(如锁骨下区域)与较低的AE发生率相关(p<0.05)。较高的NPPIP与较低的刺激相关和硬件相关AE(p<0.05)、常见的AE如导线移位、疼痛和感染(p<0.05)以及与操作相关的额外手术(p<0.05)相关。
将IPG植入更靠近导线的位置与AE减少相关。PNS是一种相对较新的操作,执行这些操作的技能和精度会随着经验的增加而提高。我们的结果表明,随着植入者对这些操作获得更多经验,与设备和操作相关的AE可能会显著减少。