Department of Materials, University of Oxford , Parks Road, Oxford, OX1 3PH, United Kingdom.
Nano Lett. 2014 Nov 12;14(11):6155-9. doi: 10.1021/nl5023095. Epub 2014 Oct 23.
The local atomic bonding of carbon atoms around the edge of graphene is examined by aberration-corrected scanning transmission electron microscopy (STEM) combined with electron energy loss spectroscopy (EELS). High-resolution 2D maps of the EELS combined with atomic resolution annular dark field STEM images enables correlations between the carbon K-edge EELS and the atomic structure. We show that energy states of graphene edges vary across individual atoms along the edge according to their specific C-C bonding, as well as perpendicular to the edge. Unique spectroscopic peaks from the EELS are assigned to specific C atoms, which enables unambiguous spectroscopic fingerprint identification for the atomic structure of graphene edges with unprecedented detail.
通过结合使用像差校正扫描透射电子显微镜(STEM)和电子能量损失光谱学(EELS),对石墨烯边缘处碳原子的局域原子键合进行了研究。EELS 的高分辨率 2D 图谱与原子分辨率环形暗场 STEM 图像相结合,使 EELS 的碳 K 边与原子结构之间能够相互关联。我们发现,沿边缘的单个原子的石墨烯边缘的能态根据其特定的 C-C 键合以及垂直于边缘的情况而有所不同。EELS 产生的独特光谱峰被分配给特定的 C 原子,这使得能够以前所未有的细节对石墨烯边缘的原子结构进行明确的光谱指纹识别。