Liu Xuan, Wang Ben-Yi, Guo Cheng-Shan
Opt Lett. 2014 Nov 1;39(21):6170-3. doi: 10.1364/OL.39.006170.
We propose, for the first time to our knowledge, a method for realizing one-step measurement of two-dimensional Jones matrix parameters of polarization-sensitive materials. This method could be called one-step Jones matrix polarization holography (JMPH). Our theoretical analysis and the experimental results demonstrate that a double-source polarization interferometer combined with angular multiplexing holography make it possible to realize one-step holographic measurements of four spatially resolved Jones matrix parameters. Compared with the existing methods, our one-step JMPH has a simpler optical arrangement and easier measuring procedure. We believe that it will provide a new approach for development of an integrated system suitable for measuring, in real-time, a Jones matrix or transmittance matrix, as well as dynamic polarization imaging.
据我们所知,我们首次提出了一种用于实现偏振敏感材料二维琼斯矩阵参数一步测量的方法。该方法可称为一步琼斯矩阵偏振全息术(JMPH)。我们的理论分析和实验结果表明,双源偏振干涉仪与角度复用全息术相结合,使得实现四个空间分辨琼斯矩阵参数的一步全息测量成为可能。与现有方法相比,我们的一步JMPH具有更简单的光学装置和更简便的测量过程。我们相信,它将为开发适用于实时测量琼斯矩阵或透射率矩阵以及动态偏振成像的集成系统提供一种新方法。