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原位温度依赖透射电子显微镜研究伪二元 mGeTe·Bi₂Te₃(m = 3-8)纳米线及第一性原理计算。

In Situ Temperature-Dependent Transmission Electron Microscopy Studies of Pseudobinary mGeTe·Bi₂Te₃ (m = 3-8) Nanowires and First-Principles Calculations.

机构信息

†Department of Chemistry, Korea University, Jochiwon 339-700, Korea.

‡Advanced Analysis Center, Korea Institute of Science and Technology, Seoul 136-791, Korea.

出版信息

Nano Lett. 2015 Jun 10;15(6):3923-30. doi: 10.1021/acs.nanolett.5b00755. Epub 2015 May 5.

Abstract

Phase-change nanowires (NWs) have emerged as critical materials for fast-switching nonvolatile memory devices. In this study, we synthesized a series of mGeTe·Bi2Te3 (GBT) pseudobinary alloy NWs-Ge3Bi2Te6 (m = 3), Ge4Bi2Te7 (m = 4), Ge5Bi2Te8 (m = 5), Ge6Bi2Te9 (m = 6), and Ge8Bi2Te11 (m = 8)-and investigated their composition-dependent thermal stabilities and electrical properties. As m decreases, the phase of the NWs evolves from the cubic (C) to the hexagonal (H) phase, which produces unique superlattice structures that consist of periodic 2.2-3.8 nm slabs for m = 3-8. In situ temperature-dependent transmission electron microscopy reveals the higher thermal stability of the compositions with lower m values, and a phase transition from the H phase into the single-crystalline C phase at high temperatures (400 °C). First-principles calculations, performed for the superlattice structures (m = 1-8) of GBT and mGeTe·Sb2Te3 (GST), show an increasing stability of the H phase (versus the C phase) with decreasing m; the difference in stability being more marked for GBT than for GST. The calculations explain remarkably the phase evolution of the GBT and GST NWs as well as the composition-dependent thermal stabilities. Measurement of the current-voltage curves for individual GBT NWs shows that the resistivity is in the range 3-25 mΩ·cm, and the resistivity of the H phase is lower than that of the C phase, which has been supported by the calculations.

摘要

相变纳米线 (NWs) 已成为快速切换非易失性存储器器件的关键材料。在这项研究中,我们合成了一系列 mGeTe·Bi2Te3 (GBT) 伪二元合金 NWs-Ge3Bi2Te6 (m = 3)、Ge4Bi2Te7 (m = 4)、Ge5Bi2Te8 (m = 5)、Ge6Bi2Te9 (m = 6) 和 Ge8Bi2Te11 (m = 8),并研究了它们的组成依赖性热稳定性和电性能。随着 m 的减小,NWs 的相从立方 (C) 相转变为六方 (H) 相,产生了独特的超晶格结构,由周期性的 2.2-3.8nm 片组成,用于 m = 3-8。原位温度依赖透射电子显微镜揭示了具有较低 m 值的组成具有更高的热稳定性,并且在高温 (400°C) 下从 H 相转变为单晶 C 相的相变。对于 GBT 和 mGeTe·Sb2Te3 (GST) 的超晶格结构 (m = 1-8) 进行的第一性原理计算表明,随着 m 的减小,H 相 (相对于 C 相) 的稳定性增加;对于 GST 来说,稳定性的差异更为显著。这些计算很好地解释了 GBT 和 GST NWs 的相演变以及组成依赖性的热稳定性。对单个 GBT NWs 的电流-电压曲线的测量表明,电阻率在 3-25 mΩ·cm 范围内,H 相的电阻率低于 C 相,这得到了计算的支持。

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