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超薄氢化硅烯和锗烯中杂质的影响:第一性原理研究。

The effect of impurities in ultra-thin hydrogenated silicene and germanene: a first principles study.

作者信息

Rupp Caroline J, Chakraborty Sudip, Ahuja Rajeev, Baierle Rogério J

机构信息

Departamento de Física, Universidade Federal de Santa Maria, 97105-900, Santa Maria, RS, Brazil.

出版信息

Phys Chem Chem Phys. 2015 Sep 14;17(34):22210-6. doi: 10.1039/c5cp03489b. Epub 2015 Aug 5.

Abstract

Spin polarized density functional theory within the GGA-PBE and HSE06 approach for the exchange correlation term has been used to investigate the stability and electronic properties of nitrogen and boron impurities in single layers of silicane and germanane. We have observed that these impurities have lower formation energies in silicane and germanane when compared to their counterparts in graphane. We have also noticed that the adsorption of H atoms in the vicinity of defects stabilizes the system. In addition, we have shown that the electronic properties of silicane and germanane can be tuned when N and B are incorporated in the Si and Ge network. N-doping and B-doping give rise to n-type and p-type semiconductor properties. However, the adsorption of H atoms quenches the doping effects.

摘要

采用广义梯度近似(GGA)-PBE和HSE06方法处理交换关联项的自旋极化密度泛函理论,用于研究硅烷和锗烷单层中氮和硼杂质的稳定性及电子性质。我们观察到,与石墨烯中的对应杂质相比,这些杂质在硅烷和锗烷中的形成能更低。我们还注意到,缺陷附近氢原子的吸附使体系更加稳定。此外,我们表明,当氮和硼掺入硅和锗网络中时,硅烷和锗烷的电子性质可以得到调控。氮掺杂和硼掺杂分别产生n型和p型半导体性质。然而,氢原子的吸附会抑制掺杂效应。

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