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氧化锆基台冠的双冠固位种植覆盖义齿的临床疗效

Clinical outcome of double crown-retained implant overdentures with zirconia primary crowns.

作者信息

Rinke Sven, Buergers Ralf, Ziebolz Dirk, Roediger Matthias

机构信息

Dental Practice, Hanau, Germany. ; Department of Prosthetics, University Medical Center Göttingen, Göttingen, Germany.

Department of Prosthetics, University Medical Center Göttingen, Göttingen, Germany.

出版信息

J Adv Prosthodont. 2015 Aug;7(4):329-37. doi: 10.4047/jap.2015.7.4.329. Epub 2015 Aug 18.

Abstract

PURPOSE

This retrospective study aims at the evaluation of implant-supported overdentures (IODs) supported by ceramo-galvanic double crowns (CGDCs: zirconia primary crowns + galvano-formed secondary crown).

MATERIALS AND METHODS

In a private practice, 14 patients were restored with 18 IODs (mandible: 11, maxilla: 7) retained by CGDCs on 4 - 8 implants and annually evaluated for technical and/or biological failures/complications.

RESULTS

One of the 86 inserted implants failed during the healing period (cumulative survival rate (CSR) implants: 98.8%). During the prosthetic functional period (mean: 5.9 ± 2.2 years), 1 implant demonstrated an abutment fracture (CSR-abutments: 98.2%), and one case of peri-implantitis was detected. All IODs remained in function (CSR-denture: 100%). A total of 15 technical complications required interventions to maintain function (technical complication rate: 0.178 treatments/patients/year).

CONCLUSION

Considering the small sample size, the use of CGDCs for the attachment of IODs is possible without an increased risk of technical complications. However, for a final evaluation, results from a larger cohort are required.

摘要

目的

本回顾性研究旨在评估由烤瓷 - 电镀双冠(CGDC:氧化锆基冠 + 电镀成型的次冠)支持的种植体支持覆盖义齿(IOD)。

材料与方法

在一家私人诊所中,14例患者使用18副IOD进行修复(下颌:11例,上颌:7例),这些IOD由CGDC固定在4 - 8颗种植体上,并每年对技术和/或生物学失败/并发症进行评估。

结果

86颗植入种植体中有1颗在愈合期失败(种植体累积生存率(CSR):98.8%)。在修复功能期(平均:5.9 ± 2.2年),1颗种植体出现基台骨折(基台CSR:98.2%),并检测到1例种植体周围炎。所有IOD均保持功能(义齿CSR:100%)。总共15例技术并发症需要干预以维持功能(技术并发症发生率:0.178次治疗/患者/年)。

结论

考虑到样本量较小,使用CGDC连接IOD是可行的,且不会增加技术并发症的风险。然而,要进行最终评估,需要更大队列的研究结果。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/b04a/4551790/cb636590263a/jap-7-329-g001.jpg

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