使用双波长光谱仪通过电荷交换光谱法测量氦与氢离子密度比的径向分布。

Measurement of radial profiles of density ratio of helium to hydrogen ion using charge exchange spectroscopy with two-wavelength spectrometer.

作者信息

Ida K, Yoshinuma M, Wieland B, Goto M, Nakamura Y, Kobayashi M, Murakami I, Moon C

机构信息

National Institute for Fusion Science, Toki 509-5292, Japan.

出版信息

Rev Sci Instrum. 2015 Dec;86(12):123514. doi: 10.1063/1.4939032.

DOI:10.1063/1.4939032

PMID:26724034

Abstract

Radial profiles of density ratio of helium to hydrogen ions are measured using the charge exchange spectroscopy technique with the two-wavelength spectrometer system in the large helical device. The two-wavelength spectrometer system consists of a dichroic mirror box, a spectrometer with two grating and two camera lenses, and one CCD detector. The dichroic mirror box is used to divide the light of one fiber from the plasma to two fibers, one for HeII (λ = 468.6 nm) and the other for H(α) (λ = 656.3 nm), that are connected to the entrance slit of the spectrometer to eliminate the interference between the HeII and the H(α) spectra on the CCD. This system provides a simultaneous measurement of helium and hydrogen ion density ratio at 8 exact same locations (8 spatial channels) with a time resolution of >40 ms in the wide range of the density ratio of 0.05-5.

摘要

在大型螺旋装置中，利用电荷交换光谱技术和双波长光谱仪系统测量了氦离子与氢离子密度比的径向分布。双波长光谱仪系统由一个二向色镜箱、一个带有两个光栅和两个相机镜头的光谱仪以及一个电荷耦合器件（CCD）探测器组成。二向色镜箱用于将来自等离子体的一根光纤的光分成两根光纤，一根用于HeII（波长λ = 468.6纳米），另一根用于H（α）（波长λ = 656.3纳米），这两根光纤连接到光谱仪的入口狭缝，以消除电荷耦合器件上HeII和H（α）光谱之间的干扰。该系统能够在密度比为0.05 - 5的宽范围内，以大于40毫秒的时间分辨率，同时测量8个完全相同位置（8个空间通道）处的氦离子与氢离子密度比。