Department of Chemistry, University of Warwick , Coventry CV4 7AL, United Kingdom.
Department of Physics, University of Warwick , Coventry CV4 7AL, United Kingdom.
Langmuir. 2016 Aug 2;32(30):7476-84. doi: 10.1021/acs.langmuir.6b01506. Epub 2016 Jul 22.
We demonstrate low-voltage electrowetting at the surface of freshly cleaved highly oriented pyrolytic graphite (HOPG). Using cyclic voltammetry (CV), electrowetting of a droplet of a sodium perchlorate solution is observed at moderately positive potentials on high-quality (low step edge coverage) HOPG, leading to significant changes in the contact angle and relative contact diameter that are comparable to the results of the widely studied electrowetting on dielectric (EWOD) system, but over a much lower voltage range. The electrowetting behavior is found to be reasonably fast, reversible, and repeatable for at least 20 cyclic scans (maximum tested). In contrast to classical electrowetting, e.g., EWOD, the electrowetting of the droplet on HOPG occurs with the intercalation/deintercalation of anions between the graphene layers of graphite, driven by the applied potential, observed in the CV response, and detected by X-ray photoelectron spectroscopy. The electrowetting behavior is strongly influenced by those factors that affect the extent of the intercalation/deintercalation of ions on graphite, such as potential range scan rate, potential polarity, quality of the HOPG substrate (step edge density and step height), and type of anion in the solution. In addition to perchlorate, sulfate salts also promote electrowetting, but some other salts do not. Our findings suggest a new mechanism for electrowetting based on ion intercalation, and the results are important to fundamental electrochemistry as well as to diversifying the means by which electrowetting can be controlled and applied.
我们在刚剥离的高取向热解石墨(HOPG)表面演示了低压电润湿。使用循环伏安法(CV),在高质量(低台阶覆盖率)HOPG 上观察到在适度正电势下的过氯酸纳溶液液滴的电润湿,导致接触角和相对接触直径发生显著变化,与广泛研究的介电电泳(EWOD)系统的结果相当,但在低得多的电压范围内。电润湿行为被发现具有相当快的速度、可逆性和可重复性,至少可进行 20 个循环扫描(最大测试)。与经典电润湿(例如 EWOD)不同,HOPG 上液滴的电润湿是通过施加的电势驱动的,在 CV 响应中观察到并通过 X 射线光电子能谱检测到,阴离子在石墨的石墨烯层之间的插层/脱插层来实现的。电润湿行为强烈受到那些影响离子在石墨上的插层/脱插层程度的因素的影响,例如电位范围扫描速率、电位极性、HOPG 基底的质量(台阶密度和台阶高度)以及溶液中阴离子的类型。除了高氯酸盐外,硫酸盐盐也促进了电润湿,但其他一些盐则没有。我们的发现提出了一种基于离子插层的新的电润湿机制,该结果对基础电化学以及多样化控制和应用电润湿的手段都非常重要。