Habel Florian, Trubetskov Michael, Pervak Vladimir
Opt Express. 2016 Jul 25;24(15):16705-10. doi: 10.1364/OE.24.016705.
We present two measurement devices which both allow the direct measurement of the group delay (GD) and group delay dispersion (GDD) of laser optics, covering the near- and mid-infrared (MIR) spectral range from 2 to 20 µm (500-5,000 cm). Two different kinds of devices were developed to measure the GDD of multilayer interference coatings. One is a resonant scanning interferometer (RSI) and the other is a white light interferometer (WLI). The WLI is also capable of measuring the GDD in transmission, for instance of bulk material. GDD measurements of a high dispersive mirror for wavelengths from 2.0 to 2.15 µm and one of a multilayer mirror from 8.5 to 12.0 µm are presented. A measurement of a zinc selenide (ZnSe) substrate in transmission was made with the WLI demonstrating the full bandwidth of the device from 1.9 to 20 µm. The comparison of all measurements with their related theoretical values shows a remarkable correspondence.
我们展示了两种测量设备,它们都能直接测量激光光学器件的群延迟(GD)和群延迟色散(GDD),覆盖2至20 µm(500 - 5,000 cm)的近红外和中红外(MIR)光谱范围。开发了两种不同类型的设备来测量多层干涉涂层的GDD。一种是共振扫描干涉仪(RSI),另一种是白光干涉仪(WLI)。WLI还能够测量透射情况下的GDD,例如块状材料的GDD。给出了波长范围为2.0至2.15 µm的高色散镜以及波长范围为8.5至12.0 µm的多层镜的GDD测量结果。使用WLI对硒化锌(ZnSe)衬底进行了透射测量,展示了该设备从1.9至20 µm的全带宽。所有测量结果与其相关理论值的比较显示出显著的一致性。