Xu Hui, Li Hongjian, Li Boxun, He Zhihui, Chen Zhiquan, Zheng Mingfei
College of Physics and Electronics, Central South University, Changsha 410083, PR China.
Sci Rep. 2016 Aug 1;6:30877. doi: 10.1038/srep30877.
We investigate a classic optical effect based on plasmon induced transparency (PIT) in a metal-insulator-metal (MIM) bus waveguide coupled with a single defective cavity. With the coupled mode theory (CMT), a theoretical model, for the single defective cavity, is established to study spectral features in the plasmonic waveguide. We can achieve a required description for the phenomenon, and the theoretical results also agree well with the finite-difference time-domain (FDTD) method. Our researches show that the defect's position and size play important roles in the PIT phenomenon. By adjusting the position and size of the defect, we can realize the PIT phenomenon well and get the required slow light effect. The proposed model and findings may provide guidance for fundamental research of the control of light in highly integrated optical circuits.
我们研究了一种基于表面等离激元诱导透明(PIT)的经典光学效应,该效应发生在与单个缺陷腔耦合的金属-绝缘体-金属(MIM)总线波导中。利用耦合模理论(CMT),建立了一个针对单个缺陷腔的理论模型,以研究等离子体波导中的光谱特性。我们能够对该现象进行所需的描述,并且理论结果与有限时域差分(FDTD)方法也吻合得很好。我们的研究表明,缺陷的位置和尺寸在PIT现象中起着重要作用。通过调整缺陷的位置和尺寸,我们可以很好地实现PIT现象并获得所需的慢光效应。所提出的模型和研究结果可为高度集成光电路中光控制的基础研究提供指导。