Accurate determination of lattice parameters based on Niggli reduced cell theory by using digitized electron diffraction micrograph.

In this paper, we used Niggli reduced cell theory to determine lattice constants of a micro/nano crystal by using electron diffraction patterns. The Niggli reduced cell method enhanced the accuracy of lattice constant measurement obviously, because the lengths and the angles of lattice vectors of a primitive cell can be measured directly on the electron micrographs instead of a double tilt holder. With the aid of digitized algorithm and least square optimization by using three digitized micrographs, a valid reciprocal Niggli reduced cell number can be obtained. Thus a reciprocal and real Bravais lattices are acquired. The results of three examples, i.e., MgZn, an unknown phase (Precipitate phase in nickel-base superalloy) and BaTiO showed that the maximum errors are 1.6% for lengths and are 0.3% for angles.