通过针尖增强拉曼散射以纳米精度成像局部电场。
Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering.
作者信息
Bhattarai A, El-Khoury P Z
机构信息
Physical Sciences Division, Pacific Northwest National Laboratory, P.O. Box 999, Richland, WA 99352, USA.
出版信息
Chem Commun (Camb). 2017 Jun 29;53(53):7310-7313. doi: 10.1039/c7cc02593a.
PMID:28480910
Abstract
Tip-enhanced Raman scattering (TERS) can be used to image plasmon-enhanced local electric field variations with extremely high spatial resolution under ambient conditions. This is illustrated through TERS images recorded using a silver atomic force microscope tip coated with strategically selected molecular reporters and used to image a sputtered silver film.
摘要
针尖增强拉曼散射（TERS）可用于在环境条件下以极高的空间分辨率对等离子体增强的局部电场变化进行成像。这通过使用涂有精心选择的分子报告基团的银原子力显微镜针尖记录的TERS图像得到了说明，该针尖用于对溅射银膜进行成像。
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