Vaz-Drago Rita, Custódio Noélia, Carmo-Fonseca Maria
Instituto de Medicina Molecular, Faculdade de Medicina, Universidade de Lisboa, Av. Prof. Egas Moniz, 1649-028, Lisbon, Portugal.
Hum Genet. 2017 Sep;136(9):1093-1111. doi: 10.1007/s00439-017-1809-4. Epub 2017 May 12.
Next-generation sequencing has revolutionized clinical diagnostic testing. Yet, for a substantial proportion of patients, sequence information restricted to exons and exon-intron boundaries fails to identify the genetic cause of the disease. Here we review evidence from mRNA analysis and entire genomic sequencing indicating that pathogenic mutations can occur deep within the introns of over 75 disease-associated genes. Deleterious DNA variants located more than 100 base pairs away from exon-intron junctions most commonly lead to pseudo-exon inclusion due to activation of non-canonical splice sites or changes in splicing regulatory elements. Additionally, deep intronic mutations can disrupt transcription regulatory motifs and non-coding RNA genes. This review aims to highlight the importance of studying variation in deep intronic sequence as a cause of monogenic disorders as well as hereditary cancer syndromes.
下一代测序技术彻底改变了临床诊断测试。然而,对于相当一部分患者来说,仅限于外显子和外显子-内含子边界的序列信息无法确定疾病的遗传原因。在此,我们回顾了来自mRNA分析和全基因组测序的证据,这些证据表明,超过75个疾病相关基因的内含子深处可能发生致病突变。距离外显子-内含子接头超过100个碱基对的有害DNA变异最常见的是由于非经典剪接位点的激活或剪接调控元件的变化导致假外显子的包含。此外,内含子深处的突变会破坏转录调控基序和非编码RNA基因。本综述旨在强调研究内含子深处序列变异作为单基因疾病以及遗传性癌症综合征病因的重要性。