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一种具有高分辨率和高达 100%占空比的 W 几何正交-飞行时间质谱仪,用于 MS/MS。

A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS.

机构信息

SCIEX, Concord, ON, Canada.

, Corning, NY, USA.

出版信息

J Am Soc Mass Spectrom. 2017 Oct;28(10):2143-2150. doi: 10.1007/s13361-017-1742-8. Epub 2017 Jul 17.

Abstract

Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342-1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as "Zeno pulsing") was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100-2000, sensitivity gains of ~5-20 are observed, for total ion currents approaching ~10 ions·s. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ.

摘要

正交注入飞行时间(orthoTOF)质谱(MS)是 TOFMS 最常见的形式,因为它可以更好地控制进入的离子能量,校正进入离子速度和位置的偏差,并能够在单次扫描中提供完整的质谱。然而,与扫描分析仪相比,orthoTOFMS 的占空比较低,当测量单一类型的离子时,扫描分析仪的占空比可以达到 100%。orthoTOFMS 的典型占空比范围为 1%至 30%,具体取决于仪器几何形状。一般来说,随着仪器分辨率的提高,占空比会降低。此外,在记录的谱图中,最高 m/z 离子的占空比最大,而对于所有其他离子,随着 m/z 的增加,占空比会减小。在之前的一篇出版物中[Loboda,A.V.;Chernushevich,I.V. J. Am. Soc. Mass Spectrom. 20,1342-1348(20)],提出了一种恢复 V 型 orthoTOFMS 占空比接近 100%的新型捕获/释放方法(称为“Zeno 脉冲”)。在这里,我们将该方法应用于具有模拟检测的 W-TOF 几何分析仪。在 100-2000 m/z 范围内,观察到总离子电流接近 10 离子·s 时,灵敏度提高了~5-20。Zeno 脉冲或类似的恢复占空比的策略将继续重要,因为通过使用离子镜,orthoTOFMS 中的仪器分辨率将会提高。

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