Área de Paleontología, Facultad de Ciencias, Edificio C (Geológicas), Universidad de Zaragoza (Zaragoza), C/ Pedro Cerbuna s/n, Spain.
J Microsc. 2018 Jan;269(1):48-58. doi: 10.1111/jmi.12607. Epub 2017 Jul 26.
We present the first study of cuticles and compressions of fossil leaves by Focused Ion Beam Scanning Electron Microscopy (FIB-SEM). Cavities preserved inside fossil leaf compressions corresponding to substomatal chambers have been observed for the first time and several new features were identified in the cross-section cuts. These results open a new way in the investigation of the three-dimensional structures of both micro- and nanostructural features of fossil plants. Moreover, the application of the FIB-SEM technique to both fossils and extant plant remains represent a new source of taxonomical, palaeoenvironmental and palaeoclimatic information.
我们首次利用聚焦离子束扫描电子显微镜（FIB-SEM）研究了化石叶片的表皮和压缩结构。首次观察到保存在化石叶片压缩物内部的对应于气孔腔的腔室，并且在横截面切口中鉴定出了几个新特征。这些结果为研究化石植物的微观和纳米结构特征的三维结构开辟了新途径。此外，FIB-SEM 技术在化石和现存植物遗骸中的应用代表了分类学、古环境和古气候信息的新来源。
