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基于低秩逼近的 X 射线透射建模在光谱失真模型光子计数探测器中基线积分估计:K 边成像应用。

Estimation of Basis Line-Integrals in a Spectral Distortion-Modeled Photon Counting Detector Using Low-Rank Approximation-Based X-Ray Transmittance Modeling: K-Edge Imaging Application.

出版信息

IEEE Trans Med Imaging. 2017 Nov;36(11):2389-2403. doi: 10.1109/TMI.2017.2746269. Epub 2017 Aug 29.

DOI:10.1109/TMI.2017.2746269
PMID:28866486
Abstract

Photon counting detectors (PCDs) provide multiple energy-dependent measurements for estimating basis line-integrals. However, the measured spectrum is distorted from the spectral response effect (SRE) via charge sharing, K-fluorescence emission, and so on. Thus, in order to avoid bias and artifacts in images, the SRE needs to be compensated. For this purpose, we recently developed a computationally efficient three-step algorithm for PCD-CT without contrast agents by approximating smooth X-ray transmittance using low-order polynomial bases. It compensated the SRE by incorporating the SRE model in a linearized estimation process and achieved nearly the minimum variance and unbiased (MVU) estimator. In this paper, we extend the three-step algorithm to K-edge imaging applications by designing optimal bases using a low-rank approximation to model X-ray transmittances with arbitrary shapes (i.e., smooth without the K-edge or discontinuous with the K-edge). The bases can be used to approximate the X-ray transmittance and to linearize the PCD measurement modeling and then the three-step estimator can be derived as in the previous approach: estimating the x-ray transmittance in the first step, estimating basis line-integrals including that of the contrast agent in the second step, and correcting for a bias in the third step. We demonstrate that the proposed method is more accurate and stable than the low-order polynomial-based approaches with extensive simulation studies using gadolinium for the K-edge imaging application. We also demonstrate that the proposed method achieves nearly MVU estimator, and is more stable than the conventional maximum likelihood estimator in high attenuation cases with fewer photon counts.

摘要

光子计数探测器 (PCD) 提供多个与能量相关的测量值,用于估计基线积分。然而,由于电荷共享、K 荧光发射等原因,测量光谱会受到光谱响应效应 (SRE) 的影响而发生失真。因此,为了避免图像中的偏差和伪影,需要对 SRE 进行补偿。为此,我们最近开发了一种用于无造影剂 PCD-CT 的计算效率高的三步算法,通过使用低阶多项式基近似平滑的 X 射线透射率来补偿 SRE。它通过在线性化估计过程中纳入 SRE 模型来补偿 SRE,并实现了几乎最小方差和无偏 (MVU) 估计器。在本文中,我们通过使用低秩逼近来设计最佳基,将三步算法扩展到 K 边成像应用中,以对具有任意形状的 X 射线透射率进行建模(即,在没有 K 边的情况下是平滑的,或者在有 K 边的情况下是不连续的)。这些基可以用于近似 X 射线透射率,并对 PCD 测量建模进行线性化,然后可以像以前的方法一样推导出三步估计器:在第一步中估计 X 射线透射率,在第二步中估计包括造影剂的基础线积分,在第三步中校正偏差。我们通过使用钆进行的广泛的仿真研究证明,与基于低阶多项式的方法相比,该方法更准确和稳定,用于 K 边成像应用。我们还证明,与传统的最大似然估计器相比,在光子计数较少的高衰减情况下,该方法可以实现几乎 MVU 估计器,并且更稳定。

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