Morani Giovanni, Mugnai Giacomo, Bolzan Bruna, Morosato Martina, Tomasi Luca, Ferrari Sara, Vassanelli Corrado
Unit of Electrophysiology, Division of Cardiology, University Hospital of Verona, Verona, Italy.
Unit of Electrophysiology, Division of Cardiology, University Hospital of Verona, Verona, Italy -
Minerva Cardioangiol. 2018 Jun;66(3):225-232. doi: 10.23736/S0026-4725.18.04497-3. Epub 2018 Jan 5.
Infection is a major complication of pacemaker (PM) and implantable cardioverter-defibrillator (ICD) implantation. The present study sought to analyze the incidence rate of device infections, to investigate possible relationships between first implantations/repeated procedures and infection rates, and to identify some main risk factors associated with infection of cardiac implantable electronic devices (CIED).
In a single center retrospective observational study, records of 3899 consecutive patients having undergone PM and ICD implantation, cardiac resynchronization therapy (CRT) or revision (device/lead replacements or upgrades) and between 2002 and 2012 were obtained.
Over a mean follow-up period of 66±14 months, a total of 50 patients were identified as having CIED infection (0.85% per procedure and 1.28% per patient). Chronic renal dysfunction and repeated procedures were independently associated with higher risk of CIED infection on multivariate analysis (respectively, OR 1.30, 95% CI: 1.16-1.57, P<0.0001; OR 1.23, 95% CI: 1.12-1.42, P<0.0001). Staphylococcal species was responsible for the bulk of CIED infections (70% of all positive cultures). Coagulase-negative staphylococci were found more frequently than staphylococcus aureus (30% vs. 12%).
The infection rate after cardiac electronic device procedures was low over the follow-up period. Repeated procedures and chronic renal dysfunction were associated with higher risk of CIED infection. Staphylococcal species were mainly responsible for device infections.
感染是起搏器(PM)和植入式心脏复律除颤器(ICD)植入的主要并发症。本研究旨在分析设备感染的发生率,探讨首次植入/重复手术与感染率之间的可能关系,并确定与心脏植入式电子设备(CIED)感染相关的一些主要危险因素。
在一项单中心回顾性观察研究中,获取了2002年至2012年间3899例连续接受PM和ICD植入、心脏再同步治疗(CRT)或翻修(设备/导线更换或升级)患者的记录。
在平均66±14个月的随访期内,共确定50例患者发生CIED感染(每次手术0.85%,每位患者1.28%)。多因素分析显示,慢性肾功能不全和重复手术与CIED感染风险较高独立相关(分别为OR 1.30,95%CI:1.16-1.57,P<0.0001;OR 1.23,95%CI:1.12-1.42,P<0.0001)。葡萄球菌是CIED感染的主要原因(所有阳性培养物的70%)。凝固酶阴性葡萄球菌比金黄色葡萄球菌更常见(30%对12%)。
在随访期内,心脏电子设备手术后的感染率较低。重复手术和慢性肾功能不全与CIED感染风险较高相关。葡萄球菌是设备感染的主要原因。