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C2/m相硅锗合金的物理性质:一项综合研究。

Physical properties of Si-Ge alloys in C2/m phase: a comprehensive investigation.

作者信息

Song Yanxing, Chai Changchun, Fan Qingyang, Zhang Wei, Yang Yintang

机构信息

State Key Discipline Laboratory of Wide BandGap Semiconductor Technology, School of Microelectronics, Xidian University, Xi'an, People's Republic of China.

出版信息

J Phys Condens Matter. 2019 Jun 26;31(25):255703. doi: 10.1088/1361-648X/ab11a2. Epub 2019 Mar 20.

Abstract

A new phase of C2/m Ge is first proposed in this paper. The structures and mechanical, anisotropic, electronic, transport and optical properties of Si-Ge alloys in the C2/m phase are studied using first principles calculations. All Ge and Si Ge alloys in the C2/m phase are proven to have mechanical and dynamic stability. By analyzing the three-dimensional (3D) perspective of the effective mass and Young's modulus, obvious anisotropies of transport and mechanical properties are found. Higher-resolution full band structures are obtained to determine the positions of the valence band maximum (VBM) and conduction band minimum (CBM). All materials have a higher photoelectron absorption than that of diamond Si. A high electronic mobility (16 527 cm V s) and hole mobility (3033 cm V s) are found in C2/m SiGe and SiGe, respectively. Based on the large mobility and photoelectron absorption, the Si-Ge alloys in the C2/m phase are promising materials for electronics and optoelectronics applications.

摘要

本文首次提出了C2/m相的Ge的新阶段。利用第一性原理计算研究了C2/m相Si-Ge合金的结构、力学、各向异性、电子、输运和光学性质。结果表明,C2/m相中的所有Ge和Si-Ge合金都具有力学和动力学稳定性。通过分析有效质量和杨氏模量的三维视角,发现了输运和力学性质的明显各向异性。获得了更高分辨率的全带结构,以确定价带最大值(VBM)和导带最小值(CBM)的位置。所有材料的光电子吸收都高于金刚石Si。在C2/m SiGe和SiGe中分别发现了高电子迁移率(16 527 cm V s)和空穴迁移率(3033 cm V s)。基于大迁移率和光电子吸收,C2/m相的Si-Ge合金是电子和光电子应用的有前途的材料。

相似文献

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Physical properties of Si-Ge alloys in C2/m phase: a comprehensive investigation.C2/m相硅锗合金的物理性质:一项综合研究。
J Phys Condens Matter. 2019 Jun 26;31(25):255703. doi: 10.1088/1361-648X/ab11a2. Epub 2019 Mar 20.

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