以静电纺聚丙烯腈纳米纤维为牺牲材料的高孔隙率多壁碳纳米管巴基纸。

Highly porous multiwalled carbon nanotube buckypaper using electrospun polyacrylonitrile nanofiber as a sacrificial material.

作者信息

Rojas J A, Ardila-Rodríguez L A, Diniz M F, Gonçalves M, Ribeiro B, Rezende M C

机构信息

Federal University of São Paulo (UNIFESP), Institute of Science and Technology, São José dos Campos, SP, 12231280, Brazil.

Technological Institute of Aeronautics (ITA), Division of Fundamental Science, São José dos Campos, SP, 12228, Brazil.

出版信息

Heliyon. 2019 Mar 22;5(3):e01386. doi: 10.1016/j.heliyon.2019.e01386. eCollection 2019 Mar.

DOI:10.1016/j.heliyon.2019.e01386

PMID:30963122

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC6434183/

Abstract

Polyacrylonitrile (PAN) was solubilized in N,N-dimethyl formamide (DMF) and the electrospinning process has been employed to obtain PAN nanofibers (PF). Multiwalled carbon nanotubes (MWCNT) were dispersed with the aid of Triton X-100 surfactant and subsequently centrifugated. Buckypapers (BP/PF) were prepared by vacuum filtration procedure of MWCNT suspension supernatant stacking four PF layers over a nylon membrane. The PF removal was carried out by immersing the BP/PF system in DMF and removal periods of 10 and 30 min were evaluated. Scanning electron microscopy (SEM) has not shown any PAN residue in the MWCNT network resulting in highly porous BP. However, by Fourier transform infrared spectroscopy (FT-IR) a PAN band was found around of 2243 cm corresponding to nitrile group (C≡N). Besides, PAN leftover was evidenced by thermogravimetric analysis (TGA), high-resolution transmission electron microscopy (HR-TEM), electrical characterization through four-point probe, nitrogen adsorption at 77 K, and X-ray diffraction (XRD).

摘要

将聚丙烯腈（PAN）溶解于N，N-二甲基甲酰胺（DMF）中，并采用静电纺丝工艺制备PAN纳米纤维（PF）。借助Triton X-100表面活性剂分散多壁碳纳米管（MWCNT），随后进行离心。通过对MWCNT悬浮液上清液进行真空过滤，在尼龙膜上堆叠四层PF来制备巴基纸（BP/PF）。通过将BP/PF体系浸入DMF中来进行PF去除，并评估了10分钟和30分钟的去除时间。扫描电子显微镜（SEM）未在MWCNT网络中显示出任何PAN残留，从而得到了高度多孔的BP。然而，通过傅里叶变换红外光谱（FT-IR）发现在2243 cm附近有一个对应于腈基（C≡N）的PAN谱带。此外，通过热重分析（TGA）、高分辨率透射电子显微镜（HR-TEM）、四点探针电表征、77 K下的氮气吸附和X射线衍射（XRD）证明了PAN残留。