Kang Min-Sung, Heo Jino, Choi Seong-Gon, Moon Sung, Han Sang-Wook
Center for Quantum Information, Korea Institute of Science and Technology (KIST), Seoul, 02792, Republic of Korea.
College of Electrical and Computer Engineering, Chungbuk National University, Chungdae-ro 1, Seowon-Gu, Cheongju, Republic of Korea.
Sci Rep. 2019 Apr 16;9(1):6167. doi: 10.1038/s41598-019-42662-4.
We present an optical scheme for a SWAP test (controlled swap operation) that can determine whether the difference between two unknown states (photons) using cross-Kerr nonlinearities (XKNLs). The SWAP test, based on quantum fingerprinting, has been widely applied to various quantum information processing (QIP) schemes. Thus, for a reliable QIP scheme, it is important to implement a scheme for a SWAP test that is experimentally feasible. Here, we utilize linearly and nonlinearly optical (XKNLs) gates to design a scheme for a SWAP test. We also analyze the efficiency and the performance of nonlinearly optical gates in our scheme under the decoherence effect and exhibit a technique employing quantum bus beams and photon-number-resolving measurements to reduce the effect of photon loss and dephasing caused by the decoherence effect. Consequently, our scheme, which is designed using linearly optical devices and XKNLs (nonlinear optics), can feasibly operate the nearly deterministic SWAP test with high efficiency, in practice.
我们提出了一种用于SWAP测试(受控交换操作)的光学方案,该方案可以利用交叉克尔非线性(XKNLs)来确定两个未知状态(光子)之间的差异。基于量子指纹识别的SWAP测试已被广泛应用于各种量子信息处理(QIP)方案。因此,对于可靠的QIP方案而言,实施一种在实验上可行的SWAP测试方案非常重要。在这里,我们利用线性和非线性光学(XKNLs)门来设计一种SWAP测试方案。我们还分析了在退相干效应下我们方案中非线性光学门的效率和性能,并展示了一种采用量子总线光束和光子数分辨测量的技术,以减少由退相干效应引起的光子损失和退相的影响。因此,我们使用线性光学器件和XKNLs(非线性光学)设计的方案实际上可以高效地可行地操作几乎确定性的SWAP测试。