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DFT + U 研究HO在化学计量和非化学计量CuO(1 1 1)表面的吸附和解离

DFT  +  U study of HO adsorption and dissociation on stoichiometric and nonstoichiometric CuO(1 1 1) surfaces.

作者信息

Ahmad Faozan, Agusta Mohammad Kemal, Maezono Ryo, Dipojono Hermawan Kresno

机构信息

Engineering Physics Research Group, Faculty of Industrial Technology, Institut Teknologi Bandung, Jl. Ganesha 10, Bandung, Indonesia. Theoretical Physics Division, Department of Physics, Bogor Agricultural University, Jl. Raya Darmaga, Bogor, Indonesia. Research Center for Nanoscience and Nanotechnology, Institut Teknologi Bandung, Jl. Ganesha 10, Bandung, Indonesia.

出版信息

J Phys Condens Matter. 2020 Jan 23;32(4):045001. doi: 10.1088/1361-648X/ab4b34. Epub 2019 Oct 4.

Abstract

Surface interaction through adsorption and dissociation between HO and metal oxides plays an important role in many industrial as well as fundamental processes. To gain further insights on the interaction, this study performs dispersion-corrected Hubbard-corrected density functional theory calculations in HO adsorption and dissociation on stoichiometric and nonstoichiometric CuO(1 1 1) surfaces. The nonstoichiometric surfaces consist of oxygen vacancy defect and oxygen-preadsorbed surfaces. This study finds that HO is chemically adsorbed on the top of Cu and Cu-Cu bridge due to the interaction of its p  orbital with d orbital of Cu. The adsorption is found to be the strongest on the surface with the oxygen vacancy defect, followed by the stoichiometric surface, and the oxygen-preadsorbed surface. The oxygen vacancy increases the reactivity for HO adsorption and reduces the reaction energy required for HO dissociation on the surface. However, the surface modification by the oxygen-preadsorbed significantly reduces the barrier energy for HO dissociation when compared with the other surfaces.

摘要

通过羟基(HO)与金属氧化物之间的吸附和解离实现的表面相互作用在许多工业过程以及基础过程中都起着重要作用。为了进一步深入了解这种相互作用,本研究对化学计量和非化学计量的CuO(1 1 1)表面上HO的吸附和解离进行了色散校正的哈伯德校正密度泛函理论计算。非化学计量表面由氧空位缺陷表面和预吸附氧的表面组成。本研究发现,由于HO的p轨道与Cu的d轨道相互作用,HO化学吸附在Cu原子顶部和Cu-Cu桥位上。研究发现,在有氧空位缺陷的表面上吸附最强,其次是化学计量表面,然后是预吸附氧的表面。氧空位增加了HO吸附的反应活性,并降低了表面上HO解离所需的反应能量。然而,与其他表面相比,预吸附氧引起的表面改性显著降低了HO解离的势垒能量。

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