Asami Mari, Kanazawa Manabu, Lam Thuy V, Thu Khaing M, Sato Daisuke, Minakuchi Shunsuke
Department of Gerodontology and Oral Rehabilitation, Graduate School of Medical and Dental Sciences, Tokyo Medical and Dental University.
Department of Implant Dentistry, School of Dentistry, Showa University.
J Oral Sci. 2020;62(1):98-102. doi: 10.2334/josnusd.19-0079.
This study evaluated marginal bone loss and prosthetic complications associated with single implant-retained mandibular overdentures (1-IODs) with locator attachments. The 1-IOD was placed in the mandibular midline by using a conventional loading protocol in 22 patients with an edentulous mandible. Marginal bone loss at the start of loading and 12 months postoperatively was assessed by radiographic and crestal bone evaluation. The crestal bone was defined as the distance between the customized abutment shoulder and the top of the bone, as indicated by probing. In addition, implant stability quotient and prosthetic complications were recorded. The cumulative implant survival rate was 95.5%. Median implant stability quotient remained greater than 80, and median radiographic bone loss was 0.56 mm. Crestal measurement showed a median crestal bone loss of 0.16, 0.43, 0.39, and 0.52 mm on the buccal, right, lingual, and left sides, respectively. Both radiographic and crestal bone loss values significantly differed between the start of implant loading and 12 months postoperatively (except on the buccal and lingual sides; P < 0.05). The need to replace the nylon insert was the most common complication. Conventional loading of a 1-IOD with a locator attachment resulted in a high survival rate, good implant stability, and acceptable marginal bone loss.
本研究评估了采用Locator附着体的单颗种植体支持的下颌覆盖义齿(1-IOD)相关的边缘骨丢失和修复并发症。在22例下颌无牙患者中,采用传统加载方案将1-IOD置于下颌中线处。通过影像学和牙槽嵴骨评估,对加载开始时和术后12个月的边缘骨丢失情况进行评估。牙槽嵴骨定义为定制基台肩部与通过探诊指示的骨顶之间的距离。此外,记录种植体稳定性商数和修复并发症。种植体累积生存率为95.5%。种植体稳定性商数中位数保持大于80,影像学骨丢失中位数为0.56 mm。牙槽嵴测量显示,颊侧、右侧、舌侧和左侧的牙槽嵴骨丢失中位数分别为0.16、0.43、0.39和0.52 mm。种植体加载开始时和术后12个月之间,影像学和牙槽嵴骨丢失值均有显著差异(颊侧和舌侧除外;P<0.05)。最常见的并发症是需要更换尼龙嵌体。采用Locator附着体对1-IOD进行传统加载可获得较高的生存率、良好的种植体稳定性和可接受的边缘骨丢失。