Characterizing the carrier-envelope phase stability of mid-infrared laser pulses by high harmonic generation in solids.

We present a novel approach for measuring the carrier-envelope phase (CEP) stability of a laser source by employing the process of high harmonic generation (HHG) in solids. HHG in solids driven by few-cycle pulses is very sensitive to the waveform of the driving pulse, therefore enabling to track the shot-to-shot CEP fluctuations of a laser source. This strategy is particularly practical for pulses at long central wavelength up to the mid-infrared spectral range where usual techniques used in the visible or near-infrared regions are challenging to transpose. We experimentally demonstrate this novel tool by measuring the CEP fluctuations of a mid-infrared laser source centered at 9.5~μm.