A detailed in-vitro study of Retinal pigment epithelium's growth as seen from the perspective of impedance spectroscopy analysis.

In this paper, we present a method to assess growth and maturation phases of the Retinal Pigment Epithelium (RPE) in-vitro at the cell layer level using impedance spectroscopy measurements on platinum electrodes. We extracted relevant parameters from an electrical circuit model fitted with the measured spectra. Based on microscopic imaging, the growth state of an independent culture developing in the same conditions is used as reference. We show that the confluence point is identified from a graphical analysis of the spectra transition as well as by observing a reconstructed parameter representing the average capacitance of the cell layer. More generally, this work presents a detailed investigation on how cell culture's state relates with either model parameter analysis or with graphical analysis of the measured spectra over a wide frequency band. While applied to the RPE, this work is also suitable for the study of any kind of monolayer epithelial cells growth.