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使用 STEM 断层扫描对大细胞体积进行切片相关的光镜和电子显微镜观察。

On-section correlative light and electron microscopy of large cellular volumes using STEM tomography.

机构信息

Institute for Molecular and Cellular Anatomy, University of Regensburg, Regensburg, Germany.

Institute for Molecular and Cellular Anatomy, University of Regensburg, Regensburg, Germany.

出版信息

Methods Cell Biol. 2021;162:171-203. doi: 10.1016/bs.mcb.2020.09.002. Epub 2020 Oct 31.

Abstract

The application of both fluorescence and electron microscopy results in a powerful combination of imaging modalities called "correlative light and electron microscopy" (CLEM). Whereas conventional transmission electron microscopy (TEM) tomography is only able to image sections up to a thickness of ~300nm, scanning transmission electron microscopy (STEM) tomography at 200kV allows the analysis of sections up to a thickness of 900nm in three dimensions. In the current study we have successfully integrated STEM tomography into CLEM as demonstrated for human retinal pigment epithelial 1 (RPE1) cells expressing various fluorescent fusion proteins which were high-pressure frozen and then embedded in Lowicryl HM20. Fluorescently labeled gold nanoparticles were applied onto resin sections and imaged by fluorescence and electron microscopy. STEM tomograms were recorded at regions of interest, and overlays were generated using the eC-CLEM software package. Through the nuclear staining of living cells, the use of fluorescently labeled gold fiducials for the generation of overlays, and the integration of STEM tomography we have markedly extended the application of the Kukulski protocol (Kukulski et al., 2011, 2012). Various fluorescently tagged proteins localizing to different cellular organelles could be assigned to their ultrastructural compartments. By combining STEM tomography with on-section CLEM, fluorescently tagged proteins can be localized in three-dimensional ultrastructural environments with a volume of at least 2.7×2.7×0.5μm.

摘要

荧光和电子显微镜的应用产生了一种强大的成像模式组合,称为“相关光和电子显微镜”(CLEM)。虽然传统的透射电子显微镜(TEM)断层扫描只能对厚度约为 300nm 的切片进行成像,但在 200kV 下的扫描透射电子显微镜(STEM)断层扫描允许在三维方向上分析厚度达 900nm 的切片。在当前的研究中,我们已经成功地将 STEM 断层扫描集成到 CLEM 中,如表达各种荧光融合蛋白的人视网膜色素上皮 1(RPE1)细胞所示,这些细胞经过高压冷冻,然后嵌入 Lowicryl HM20 中。荧光标记的金纳米颗粒被应用于树脂切片,并通过荧光和电子显微镜进行成像。在感兴趣的区域记录 STEM 断层扫描,并使用 eC-CLEM 软件包生成叠加图。通过对活细胞进行核染色、使用荧光标记的金基准点生成叠加图以及集成 STEM 断层扫描,我们显著扩展了 Kukulski 方案(Kukulski 等人,2011 年,2012 年)的应用。可以将定位于不同细胞细胞器的各种荧光标记蛋白分配到它们的超微结构隔室中。通过将 STEM 断层扫描与切片上的 CLEM 相结合,可以将荧光标记蛋白定位在三维超微结构环境中,体积至少为 2.7×2.7×0.5μm。

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