Aso Kohei, Maebe Jens, Tran Xuan Quy, Yamamoto Tomokazu, Oshima Yoshifumi, Matsumura Syo
School of Materials Science, Japan Advanced Institute of Science and Technology, Asahidai 1-1, Nomi, Ishikawa 923-1292, Japan.
Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Motooka 744, Nishi-ku, Fukuoka 819-0395, Japan.
ACS Nano. 2021 Jul 27;15(7):12077-12085. doi: 10.1021/acsnano.1c03413. Epub 2021 Jul 7.
Analysis of subpercent local strain is important for a deeper understanding of nanomaterials, whose properties often depend on the strain. Conventional strain analysis has been performed by measuring interatomic distances from scanning transmission electron microscopy (STEM) images. However, measuring subpercent strain remains a challenge because the peak positions in STEM images do not precisely correspond to the real atomic positions due to disturbing influences, such as random noise and image distortion. Here, we utilized an advanced data-driven analysis method, Gaussian process regression, to predict the true strain distribution by reconstructing the true atomic positions. As a result, a precision of 0.2% was achieved in strain measurement at the atomic scale. The method was applied to gold nanoparticles of different shapes to reveal the shape dependence of the strain distribution. A spherical gold nanoparticle showed a symmetric strain distribution with a contraction of ∼1% near the surface owing to surface relaxation. By contrast, a gold nanorod, which is a cylinder terminated by hemispherical caps on both sides, showed nonuniform strain distributions with lattice expansions of ∼0.5% along the longitudinal axis around the caps except for the contraction at the surface. Our results indicate that the strain distribution depends on the shape of the nanomaterials. The proposed data-driven analysis is a convenient and powerful tool to measure the strain distribution with high precision at the atomic scale.
分析亚百分比局部应变对于更深入理解纳米材料非常重要,因为纳米材料的性质通常取决于应变。传统的应变分析是通过测量扫描透射电子显微镜(STEM)图像中的原子间距离来进行的。然而,测量亚百分比应变仍然是一个挑战,因为由于随机噪声和图像失真等干扰因素,STEM图像中的峰值位置并不精确对应于真实的原子位置。在这里,我们利用一种先进的数据驱动分析方法——高斯过程回归,通过重建真实的原子位置来预测真实的应变分布。结果,在原子尺度上的应变测量中实现了0.2%的精度。该方法被应用于不同形状的金纳米颗粒,以揭示应变分布的形状依赖性。球形金纳米颗粒显示出对称的应变分布,由于表面弛豫,其表面附近收缩约1%。相比之下,金纳米棒是一种两端由半球形帽终止的圆柱体,除了表面收缩外,在帽周围沿纵轴显示出约0.5%的晶格膨胀的非均匀应变分布。我们的结果表明,应变分布取决于纳米材料的形状。所提出的数据驱动分析是一种在原子尺度上高精度测量应变分布的便捷而强大的工具。