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自旋轨道耦合的IrO中维度驱动的金属-绝缘体转变

Dimensionality-driven metal-insulator transition in spin-orbit-coupled IrO.

作者信息

Arias-Egido E, Laguna-Marco M A, Piquer C, Jiménez-Cavero P, Lucas I, Morellón L, Gallego F, Rivera-Calzada A, Cabero-Piris M, Santamaria J, Fabbris G, Haskel D, Boada R, Díaz-Moreno S

机构信息

Instituto de Nanociencia y Materiales de Aragón (INMA), CSIC - Universidad de Zaragoza, Zaragoza 50009, Spain.

Departamento de Física de la Materia Condensada, Universidad de Zaragoza, Zaragoza 50009, Spain.

出版信息

Nanoscale. 2021 Oct 21;13(40):17125-17135. doi: 10.1039/d1nr04207f.

Abstract

A metal-insulator transition is observed in spin-orbit-coupled IrO thin films upon reduction of the film thickness. In the epitaxially grown samples, the critical thickness ( ∼ 1.5-2.2 nm) is found to depend on growth orientation (001), (100) or (110). Interestingly from the applied point of view, the insulating behavior is found even in polycrystalline ultrathin films. By analyzing the experimental electrical response with various theoretical models, we find good fits to the Efros-Shklovskii-VRH and the Arrhenius-type behaviors, which suggests an important role of electron correlations in determining the electrical properties of IrO. Our magnetic measurements also point to a significant role of magnetic order. Altogether, our results would point to a mixed Slater- and Mott-type of insulator.

摘要

在自旋轨道耦合的IrO薄膜中,随着薄膜厚度的减小,观察到了金属-绝缘体转变。在外延生长的样品中,发现临界厚度(约1.5 - 2.2纳米)取决于生长取向(001)、(100)或(110)。从应用角度来看有趣的是,即使在多晶超薄膜中也发现了绝缘行为。通过用各种理论模型分析实验电响应,我们发现与Efros-Shklovskii-VRH和阿仑尼乌斯型行为有很好的拟合,这表明电子关联在决定IrO的电学性质中起重要作用。我们的磁性测量也表明磁有序起重要作用。总之,我们的结果表明是一种混合的斯莱特型和莫特型绝缘体。

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