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由BiOSe和过渡金属二硫属化物单层形成的异质结构的电荷转移特性。

Charge Transfer Properties of Heterostructures Formed by Bi O Se and Transition Metal Dichalcogenide Monolayers.

作者信息

Liu Shuangyan, He Dawei, Tan Congwei, Fu Shaohua, Han Xiuxiu, Huang Mohan, Miao Qing, Zhang Xiaoxian, Wang Yongsheng, Peng Hailin, Zhao Hui

机构信息

Key Laboratory of Luminescence and Optical Information, Ministry of Education, Institute of Optoelectronic Technology, Beijing Jiaotong University, Beijing, 100044, P. R. China.

Center for Nanochemistry, Beijing Science and Engineering Center for Nanocarbons, Beijing National Laboratory for Molecular Sciences (BNLMS), College of Chemistry and Molecular Engineering, Peking University, Beijing, 100871, P. R. China.

出版信息

Small. 2022 Feb;18(7):e2106078. doi: 10.1002/smll.202106078. Epub 2021 Dec 3.

Abstract

Atomically thin bismuth oxyselenide (Bi O Se) exhibits attractive properties for electronic and optoelectronic applications, such as high charge-carrier mobility and good air stability. Recently, the development of Bi O Se-based heterostructures have attracted enormous interests with promising prospects for diverse device applications. Although the electrical properties of Bi O Se-based heterostructures have been widely studied, the interlayer charge transfer in these heterostructures remains elusive, despite its importance in harnessing their emergent functionalities. Here, a comprehensive experimental investigation on the interlayer charge transfer properties of two heterostructures formed by Bi O Se and representative transition metal dichalcogenides (namely, WS /Bi O Se and MoS /Bi O Se) is reported. Kelvin probe force microscopy is used to measure the work functions of the samples, which are further employed to establish type-II band alignment of both heterostructures. Photoluminescence quenching is observed in each heterostructure, suggesting high charge transfer efficiency. Time-resolved and layer-selective pump-probe measurements further prove the ultrafast interlayer charge transfer processes and formation of long-lived interlayer excitons. These results establish the feasibility of integrating 2D Bi O Se with other 2D semiconductors to fabricate heterostructures with novel charge transfer properties and provide insight for understanding the performance of optoelectronic devices based on such 2D heterostructures.

摘要

原子级薄的氧硒化铋(Bi₂O₂Se)在电子和光电子应用中展现出吸引人的特性,例如高载流子迁移率和良好的空气稳定性。最近,基于Bi₂O₂Se的异质结构的发展引起了极大的兴趣,在各种器件应用方面具有广阔前景。尽管基于Bi₂O₂Se的异质结构的电学性质已得到广泛研究,但这些异质结构中的层间电荷转移仍不清楚,尽管其对于利用它们的新兴功能很重要。在此,报道了对由Bi₂O₂Se和代表性过渡金属二硫属化物(即WS₂/Bi₂O₂Se和MoS₂/Bi₂O₂Se)形成的两种异质结构的层间电荷转移性质进行的全面实验研究。开尔文探针力显微镜用于测量样品的功函数,进而用于建立两种异质结构的II型能带排列。在每个异质结构中都观察到光致发光猝灭,表明电荷转移效率高。时间分辨和层选择性泵浦 - 探测测量进一步证明了超快的层间电荷转移过程和长寿命层间激子的形成。这些结果确立了将二维Bi₂O₂Se与其他二维半导体集成以制造具有新颖电荷转移性质的异质结构的可行性,并为理解基于此类二维异质结构的光电器件的性能提供了见解。

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