镍与尖齿:颅内支架镍过敏的神话

Nickels and tines: the myth of nickel allergy in intracranial stents.

作者信息

Vanent Kevin N, Federico Emma M, Bass David I, Barros Guilherme, Keen Jade, Levitt Michael R

机构信息

School of Medicine, University of Washington, Seattle, WA, USA.

Neurological Surgery, University of Washington, Seattle, Washington, USA.

出版信息

J Neurointerv Surg. 2022 Dec;14(12):1244-1247. doi: 10.1136/neurintsurg-2021-018365. Epub 2022 Jan 5.

Abstract

BACKGROUND

Most intracranial stents contain nickel alloy, and nickel allergy or hypersensitivity is common. Neurological injury following endovascular treatment with a nickel containing intracranial stent has been reported in patients with purported nickel allergy, but it is unclear whether these reactions represent true nickel hypersensitivity. We quantified nickel release from commonly used intracranial stents to investigate whether such stents should be avoided in patients with nickel allergy.

METHODS

We examined nickel release from seven commonly used intracranial stents: Enterprise, LVIS Jr, Neuroform, Wingspan, Zilver, Pipeline Flex Embolization Device, and Surpass Evolve. We incubated each stent in human plasma-like media for 30 days. Dimethylglyoxime (DMG) spot testing was performed on each stent to detect released nickel at 0 and 30 days. Inductively coupled plasma-optical emission spectroscopy (ICP-OES) was then used to quantify the nickel concentration of the media at 30 days. Nickel currency and nickel standard for atomic absorption spectrometry were used as positive controls.

RESULTS

DMG spot tests indicated nickel release only from nickel currency at 0 and 30 days of incubation. No nickel release was detected from any stent at 30 days using ICP-OES.

CONCLUSIONS

Nickel release from commonly used intracranial stents is negligible. These results suggest that previously reported hypersensitivity to these stents may be misattributed to nickel allergy, and that patients with nickel allergy may be safely treated with select nickel-containing stents.

摘要

背景

大多数颅内支架含有镍合金,镍过敏或超敏反应很常见。据报道,在疑似镍过敏的患者中,使用含镍颅内支架进行血管内治疗后出现了神经损伤,但尚不清楚这些反应是否代表真正的镍超敏反应。我们对常用颅内支架的镍释放量进行了量化,以研究镍过敏患者是否应避免使用此类支架。

方法

我们检测了七种常用颅内支架的镍释放情况:Enterprise、LVIS Jr、Neuroform、Wingspan、Zilver、Pipeline Flex栓塞装置和Surpass Evolve。我们将每个支架在类人血浆培养基中孵育30天。在第0天和第30天对每个支架进行二甲基乙二肟(DMG)斑点试验,以检测释放的镍。然后使用电感耦合等离子体发射光谱法(ICP-OES)在第30天对培养基中的镍浓度进行量化。镍币和原子吸收光谱法的镍标准物用作阳性对照。

结果

DMG斑点试验表明,在孵育的第0天和第30天,只有镍币释放出镍。使用ICP-OES在第30天未检测到任何支架释放镍。

结论

常用颅内支架的镍释放量可忽略不计。这些结果表明,先前报道的对这些支架的超敏反应可能被错误地归因于镍过敏,镍过敏患者可以安全地使用某些含镍支架进行治疗。

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