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由折射率推断的高压下二氧化硅玻璃的电学、结构和力学性质

Electronic, Structural, and Mechanical Properties of SiO_{2} Glass at High Pressure Inferred from its Refractive Index.

作者信息

Lobanov Sergey S, Speziale Sergio, Winkler Björn, Milman Victor, Refson Keith, Schifferle Lukas

机构信息

Deutsches GeoForschungsZentrum GFZ, Telegrafenberg, 14473 Potsdam, Germany.

Institut für Geowissenschaften, Universität Potsdam, Karl-Liebknecht-Str. 24-25, Golm 14476, Germany.

出版信息

Phys Rev Lett. 2022 Feb 18;128(7):077403. doi: 10.1103/PhysRevLett.128.077403.

Abstract

We report the first direct measurements of the refractive index of silica glass up to 145 GPa that allowed quantifying its density, bulk modulus, Lorenz-Lorentz polarizability, and band gap. These properties show two major anomalies at ∼10 and ∼40  GPa. The anomaly at ∼10  GPa signals the onset of the increase in Si coordination, and the anomaly at ∼40  GPa corresponds to a nearly complete vanishing of fourfold Si. More generally, we show that the compressibility and density of noncrystalline solids can be accurately measured in simple optical experiments up to at least 110 GPa.

摘要

我们报告了对二氧化硅玻璃折射率进行的首次直接测量,测量压力高达145吉帕斯卡,这使得能够量化其密度、体积模量、洛伦兹 - 洛伦茨极化率和带隙。这些性质在约10吉帕斯卡和约40吉帕斯卡处显示出两个主要异常。约10吉帕斯卡处的异常标志着硅配位增加的开始,约40吉帕斯卡处的异常对应于四重硅几乎完全消失。更普遍地说,我们表明,在至少高达110吉帕斯卡的简单光学实验中,可以准确测量非晶态固体的压缩性和密度。

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