Running Katherine L D, Momotaz Aliya, Kariyawasam Gayan K, Zurn Jason D, Acevedo Maricelis, Carter Arron H, Liu Zhaohui, Faris Justin D
Department of Plant Science, North Dakota State University, Fargo, ND, United States.
USDA-Agricultural Research Service, Sugarcane Field Station, Canal Point, FL, United States.
Front Plant Sci. 2022 Mar 23;13:793925. doi: 10.3389/fpls.2022.793925. eCollection 2022.
The necrotrophic fungal pathogen () causes the foliar disease tan spot in both bread wheat and durum wheat. Wheat lines carrying the tan spot susceptibility gene are sensitive to the -produced necrotrophic effector (NE) Ptr ToxC. A compatible interaction results in leaf chlorosis, reducing yield by decreasing the photosynthetic area of leaves. Developing genetically resistant cultivars will effectively reduce disease incidence. Toward that goal, the production of chlorosis in response to inoculation with Ptr ToxC-producing isolates was mapped in two low-resolution biparental populations derived from LMPG-6 × PI 626573 (LP) and Louise × Penawawa (LouPen). In total, 58 genetic markers were developed and mapped, delineating the candidate gene region to a 1.4 centiMorgan (cM) genetic interval spanning 184 kb on the short arm of chromosome 1A. A total of nine candidate genes were identified in the Chinese Spring reference genome, seven with protein domains characteristic of resistance genes. Mapping of the chlorotic phenotype, development of genetic markers, both for genetic mapping and marker-assisted selection (MAS), and the identification of candidate genes provide a foundation for map-based cloning of .
坏死营养型真菌病原体（）在面包小麦和硬粒小麦中都会引发叶部病害褐斑病。携带褐斑病感病基因的小麦品系对产生的坏死营养型效应子（NE）Ptr ToxC敏感。亲和互作会导致叶片褪绿，通过减少叶片的光合面积从而降低产量。培育具有遗传抗性的品种将有效降低发病率。为实现这一目标，在两个低分辨率双亲群体（来源于LMPG - 6×PI 626573（LP）和Louise×Penawawa（LouPen））中对接种产生Ptr ToxC的分离株后出现的褪绿现象进行了定位。总共开发并定位了58个遗传标记，将候选基因区域划定在1A染色体短臂上一个跨度为184 kb、长度为1.4厘摩（cM）的遗传区间内。在中国春参考基因组中总共鉴定出9个候选基因，其中7个具有抗性基因特有的蛋白质结构域。对褪绿表型的定位、用于遗传作图和标记辅助选择（MAS）的遗传标记的开发以及候选基因的鉴定为基于图谱克隆提供了基础。
