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房间隔缺损封堵器晚期栓塞的新病因

Novel Cause of Late Atrial Septal Defect Devices Embolization.

作者信息

Ba-Atiyah Wejdan, Gabel Hala, Jamjoom Ahmad, Al-Ata Jameel

机构信息

Pediatric Cardiology, KFSH&RC - Jeddah, Jeddah, Saudi Arabia.

Pediatric Cardiology, KAUH, East Jeddah General Hospital, Jeddah, Saudi Arabia.

出版信息

J Saudi Heart Assoc. 2023 Mar 13;35(1):50-54. doi: 10.37616/2212-5043.1330. eCollection 2023.

Abstract

Transcatheter closure of septal defects using specialized devices is a common procedure that has a high success rate. Embolization of Atrial septal defect devices is a known complication seen at a rate of 0.5%. We report a case of late ASD device occluder embolization immediately after brain MRI with clinical consequences and intraoperative evidence of right atrial wall thermal injury. To our knowledge Atrial septal occluder (ASO) device embolization post magnetic resonance imaging (MRI) was not reported before, although theoretically possible and that's why six to eight weeks post device implantation MRI is prohibited even with current MRI compatible devices.

摘要

使用专门装置经导管闭合间隔缺损是一种成功率很高的常见手术。房间隔缺损装置的栓塞是一种已知并发症,发生率为0.5%。我们报告一例在脑部MRI检查后立即发生的晚期房间隔缺损装置封堵器栓塞病例,该病例产生了临床后果,术中发现右心房壁有热损伤迹象。据我们所知,尽管理论上有可能,但此前尚未有磁共振成像(MRI)后房间隔封堵器(ASO)装置栓塞的报道,这就是为什么即使使用目前与MRI兼容的装置,在装置植入后六至八周内仍禁止进行MRI检查。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/bf8f/10069705/09dfa5ba1c4b/sha50-54f1.jpg

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