Kalinauskas Putinas, Staišiūnas Laurynas, Grigucevičienė Asta, Leinartas Konstantinas, Šilėnas Aldis, Bučinskienė Dalia, Juzeliūnas Eimutis
Center for Physical Sciences and Technology, Saulėtekio av. 3, LT 10257 Vilnius, Lithuania.
Materials (Basel). 2023 Mar 30;16(7):2785. doi: 10.3390/ma16072785.
A photoelectrode for hydrogen evolution reaction (HER) is proposed, which is based on p-type silicon (p-Si) passivated with an ultrathin (10 nm) alumina (AlO) layer and modified with microformations of a nickel catalyst. The AlO layer was formed using atomic layer deposition (ALD), while the nickel was deposited photoelectrochemically. The alumina film improved the electronic properties of the substrate and, at the same time, protected the surface from corrosion and enabled the deposition of nickel microformations. The Ni catalyst increased the HER rate up to one order of magnitude, which was comparable with the rate measured on a hydrogen-terminated electrode. Properties of the alumina film on silicon were comprehensively studied. Grazing incidence X-ray diffraction (GI-XRD) identified the amorphous structure of the ALD oxide layer. Optical profilometry and spectroscopic ellipsometry (SE) showed stability of the film in an acid electrolyte. Resistivity measurements showed that annealing of the film increases its electric resistance by four times.
提出了一种用于析氢反应(HER)的光电极,它基于用超薄(10纳米)氧化铝(AlO)层钝化并经镍催化剂微结构修饰的p型硅(p-Si)。AlO层通过原子层沉积(ALD)形成,而镍通过光电化学沉积。氧化铝膜改善了基底的电子性能,同时保护表面免受腐蚀,并使得镍微结构能够沉积。镍催化剂将析氢反应速率提高了一个数量级,这与在氢终止电极上测得的速率相当。对硅上氧化铝膜的性能进行了全面研究。掠入射X射线衍射(GI-XRD)确定了ALD氧化层的非晶结构。光学轮廓仪和光谱椭偏仪(SE)显示了该膜在酸性电解质中的稳定性。电阻率测量表明,膜的退火使其电阻增加了四倍。