Programa de Pós-Graduação em Engenharia Física, Unidade Acadêmica do Cabo de Santo Agostinho, Universidade Federal Rural de Pernambuco, Cabo de Santo Agostinho, Pernambuco, 54518-430, Brazil.
Programa de Pós-Graduação em Ciência de Materiais, Universidade Federal de Pernambuco, Recife, Pernambuco, 50740-560, Brazil.
Sci Rep. 2023 May 4;13(1):7239. doi: 10.1038/s41598-023-34486-0.
Light scattering, whether caused by desired or spurious elements, is considered one of the main phenomena that present great challenges for the nonlinear (NL) optical characterization of turbid media. The most relevant disturbing factor is the random deformation suffered by the spatial intensity distribution of the laser beam due to multiple scattering. In this work, we report the intensity correlation scan (IC-scan) technique as a new tool to characterize the NL optical response of scattering media, by taking advantage of light scattering to generate speckle patterns sensitive to wavefront changes induced by the self-focusing and self-defocusing effects. Peak-to-valley transmittance curves, with a higher signal-to-noise ratio, are obtained by analyzing the spatial intensity correlation functions of the different speckle patterns, even in very turbid media where conventional NL spectroscopy techniques fail. To demonstrate the potential of the IC-scan technique, the NL characterization of colloids that contain a high concentration of silica nanospheres as scatterers, as well as gold nanorods, which act as NL particles and light scatterers, was performed. The results show that the IC-scan technique is more accurate, precise and robust to measure NL refractive indices in turbid media, overcoming limitations imposed by well-established Z-scan and D4σ techniques.
光散射,无论是由有意还是偶然的因素引起的,都被认为是混浊介质的非线性(NL)光学特性描述中面临的主要挑战之一。最相关的干扰因素是激光束的空间强度分布由于多次散射而发生的随机变形。在这项工作中,我们报告了强度相关扫描(IC-scan)技术作为一种新的工具,可以利用光散射来产生对自聚焦和自散焦效应引起的波前变化敏感的散斑图案,从而对散射介质的 NL 光学响应进行特征描述。通过分析不同散斑图案的空间强度相关函数,可以获得具有更高信噪比的峰值-谷值透过率曲线,即使在传统 NL 光谱技术失败的非常混浊的介质中也是如此。为了展示 IC-scan 技术的潜力,对含有高浓度二氧化硅纳米球作为散射体的胶体以及作为 NL 粒子和光散射体的金纳米棒进行了 NL 特性描述。结果表明,IC-scan 技术在混浊介质中测量 NL 折射率更准确、更精确、更稳健,克服了已建立的 Z 扫描和 D4σ 技术的局限性。