Geng Tao, Wang Jihao, Meng Wenjie, Zhang Jing, Feng Qiyuan, Hou Yubin, Lu Yalin, Lu Qingyou
Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, Anhui 230031, China; The High Magnetic Field Laboratory of Anhui Province, Hefei, Anhui 230031, China.
Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, Anhui 230031, China; The High Magnetic Field Laboratory of Anhui Province, Hefei, Anhui 230031, China.
Ultramicroscopy. 2023 Nov;253:113817. doi: 10.1016/j.ultramic.2023.113817. Epub 2023 Jul 26.
We present a mechanism for directly positioning the tip over a micron-size sample by tracking the trajectory of the tip and tip shadow. A bilayer graphene sheet identified by Raman spectroscopy with a lateral size of 20 μm × 50 μm was transferred on the surface of shaped gold electrodes, on which it will be rapidly captured by a homebuilt scanning tunneling microscopy (STM) with the help of an optical microscope. Using the improved line-based imaging mode, atomic-resolution images featuring a hexagonal lattice structure on the bilayer graphene sheet were obtained by our positioning-capable STM. We have also observed a unique O-ring superstructure on graphene surface that caused by the collective interference near the boundaries or defects. Furthermore, we successfully captured a graphene sheet of size as small as 1.3 nm by a rapid and large-area searching operation; this is the first time that such a small graphene sheet has been observed with atomic resolution. The STM images of a micron-size graphene sheet illustrate the significant positioning ability and imaging precision of our homebuilt STM. Our results contribute to further STM studies on samples with ultra-small size.
我们提出了一种通过跟踪针尖及其阴影的轨迹将针尖直接定位在微米级样品上方的机制。通过拉曼光谱鉴定的横向尺寸为20μm×50μm的双层石墨烯片被转移到成型金电极表面,在光学显微镜的帮助下,它将被一台自制的扫描隧道显微镜(STM)快速捕获。使用改进的基于线的成像模式,通过我们具有定位能力的STM获得了双层石墨烯片上具有六边形晶格结构的原子分辨率图像。我们还观察到石墨烯表面由边界或缺陷附近的集体干涉引起的独特O环超结构。此外,我们通过快速大面积搜索操作成功捕获了尺寸小至1.3nm的石墨烯片;这是首次以原子分辨率观察到如此小的石墨烯片。微米级石墨烯片的STM图像展示了我们自制STM的显著定位能力和成像精度。我们的结果有助于对超小尺寸样品进行进一步的STM研究。