Dzedzickis Andrius, Rožėnė Justė, Bučinskas Vytautas, Viržonis Darius, Morkvėnaitė-Vilkončienė Inga
Department of Mechatronics, Robotics, and Digital Manufacturing, Vilnius Gediminas Technical University, Plytines 25, 10105 Vilnius, Lithuania.
Materials (Basel). 2023 Sep 24;16(19):6379. doi: 10.3390/ma16196379.
In this paper, we provide a systematic review of atomic force microscopy (AFM), a fast-developing technique that embraces scanners, controllers, and cantilevers. The main objectives of this review are to analyze the available technical solutions of AFM, including the limitations and problems. The main questions the review addresses are the problems of working in contact, noncontact, and tapping AFM modes. We do not include applications of AFM but rather the design of different parts and operation modes. Since the main part of AFM is the cantilever, we focused on its operation and design. Information from scientific articles published over the last 5 years is provided. Many articles in this period disclose minor amendments in the mechanical system but suggest innovative AFM control and imaging algorithms. Some of them are based on artificial intelligence. During operation, control of cantilever dynamic characteristics can be achieved by magnetic field, electrostatic, or aerodynamic forces.
在本文中，我们对原子力显微镜（AFM）进行了系统综述，这是一种快速发展的技术，涵盖扫描仪、控制器和悬臂。本综述的主要目的是分析AFM的现有技术解决方案，包括其局限性和问题。该综述所涉及的主要问题是接触式、非接触式和轻敲式AFM模式下的工作问题。我们不包括AFM的应用，而是不同部件的设计和操作模式。由于AFM的主要部分是悬臂，我们重点关注其操作和设计。提供了过去5年发表的科学文章中的信息。这一时期的许多文章披露了机械系统中的微小改进，但提出了创新的AFM控制和成像算法。其中一些基于人工智能。在操作过程中，可以通过磁场、静电力或气动力实现对悬臂动态特性的控制。
