Ma Chung Ting, Kirby Brian J, Li Xiaopu, Poon S Joseph
Department of Physics, University of Virginia, Charlottesville, Virginia 22904, USA.
NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Appl Phys Lett. 2018;113(17). doi: 10.1063/1.5050626.
Magnetic compensation in ferrimagnets plays an important role in spintronic and magnetic recording devices. Experimental results have demonstrated a thickness dependence of the compensation temperature ( ) in amorphous TbFeCo thin films. It was speculated that this thickness dependence originated from a variation in the short-range order. In this work, we have investigated the depth-resolved compositional and magnetization profiles using polarized neutron reflectometry. We find that although the composition is uniform across the film thickness, near the substrate interface, the magnetization exhibits a different temperature dependence from that of the rest of the sample. Monte Carlo simulations show that it is this difference in interfacial magnetization that causes the aforementioned thickness dependence of the compensation. These results demonstrate the critical role of the substrate interface in determining the magnetic properties of amorphous ferrimagnetic thin films for spintronic applications.
亚铁磁体中的磁补偿在自旋电子学和磁记录设备中起着重要作用。实验结果表明,非晶TbFeCo薄膜的补偿温度( )与厚度有关。据推测,这种厚度依赖性源于短程有序的变化。在这项工作中,我们使用极化中子反射仪研究了深度分辨的成分和磁化分布。我们发现,尽管整个薄膜厚度上的成分是均匀的,但在靠近衬底界面处,磁化表现出与样品其余部分不同的温度依赖性。蒙特卡罗模拟表明,正是界面磁化的这种差异导致了上述补偿的厚度依赖性。这些结果证明了衬底界面在确定用于自旋电子学应用的非晶亚铁磁薄膜磁性能方面的关键作用。