Yang Mingyang, Huang Haiming, Zhao Wenyu
School of Materials Science and Engineering, Hubei University of Automotive Technology, Shiyan, 442002, China.
Hubei Key Laboratory of Energy Storage and Power Battery, Hubei University of Automotive Technology, Shiyan, 442002, China.
J Mol Model. 2024 Jul 2;30(7):238. doi: 10.1007/s00894-024-06042-8.
The bandgap modulation and electronic properties modulation of two-dimensional HfSiN monolayer induced by strain, electric field and atomic adsorption are studied by first principles. The HfSiN monolayer was found to be dynamically, thermally, and mechanically stable at equilibrium, and it is a direct semiconductor with a bandgap of 1.87 eV. The bandgap of the HfSiN monolayer can be precisely modulated by strain. Under the action of strain, HfSiN monolayer not only transforms from direct semiconductor to indirect semiconductor, but also improves the absorption of visible light. An external electric field in the 0-0.5 eV/Å range can also modulate the bandgap of HfSiN monolayer from 1.87 eV to 0 eV, and most importantly, at an external electric field of 0.5 eV/Å, HfSiN monolayer shows the characteristics of spin gapless semiconductor. The calculated adsorption energy shows that the structures of H, O and F atoms adsorbed by HfSiN monolayer can all exist stably. The bandgap of the configuration after adsorption of O and F atoms is significantly reduced compared with that of HfSiN monolayer. Furthermore, the HfSiN monolayer after adsorption of H and F atoms is transformed into a magnetic semiconductor. METHOD: All calculations were performed using Vienna ab initial simulation package, The electronic structure, mechanical properties, electronic properties and other properties were carried out using generalized gradient approximation (GGA-PBE), supplemented by HSE06 and GGA + U. The total-energy and force convergence are less than 10 eV and 0.001 eV/Å, respectively. The vacuum on the z-axis is selected 20 Å. The vdW interactions were corrected using the Grimme scheme (DFT-D3).
采用第一性原理研究了应变、电场和原子吸附对二维HfSiN单层的带隙调制和电子性质调制。发现HfSiN单层在平衡态下具有动力学、热学和力学稳定性,是一种带隙为1.87 eV的直接半导体。HfSiN单层的带隙可通过应变精确调制。在应变作用下,HfSiN单层不仅从直接半导体转变为间接半导体,还提高了对可见光的吸收。0 - 0.5 eV/Å范围内的外部电场也可将HfSiN单层的带隙从1.87 eV调制到0 eV,最重要的是,在0.5 eV/Å的外部电场下,HfSiN单层表现出自旋无隙半导体的特性。计算得到的吸附能表明,HfSiN单层吸附H、O和F原子的结构均能稳定存在。与HfSiN单层相比,吸附O和F原子后的构型带隙显著减小。此外,吸附H和F原子后的HfSiN单层转变为磁性半导体。方法:所有计算均使用Vienna ab初始模拟包进行,电子结构、力学性能、电子性质等性质采用广义梯度近似(GGA - PBE)计算,并辅以HSE06和GGA + U。总能和力的收敛分别小于10 eV和0.001 eV/Å。z轴上的真空选取为20 Å。采用Grimme方案(DFT - D3)校正范德华相互作用。