对扭曲二硫化钼双层膜中扭曲外延金纳米盘的扫描透射电子显微镜观察。
Scanning transmission election microscopy observations of twisted epitaxial gold nanodiscs in twisted molybdenum disulfide bilayers.
作者信息
Cui Yi, Czaja Pawel, Cui Yi, Sinclair Robert
机构信息
Department of Materials Science and Engineering, Stanford University, Stanford 94305, USA.
Department of Materials Science and Engineering, Stanford University, Stanford 94305, USA.
出版信息
Micron. 2025 Mar;190:103776. doi: 10.1016/j.micron.2024.103776. Epub 2024 Dec 27.
Atomic scale, scanning transmission electron microscopy (STEM) analysis of the moiré structures in twisted epitaxial gold nanodiscs encapsulated in twisted bilayer molybdenum disulfide is presented. High angle annular dark field STEM imaging reveals that the period of the moiré patterns between gold and molybdenum disulfide varies with different twist angles of the bilayer molybdenum disulfide, ranging from 1.80 nm (epitaxial alignment of gold) to 1.53 nm (twisted epitaxial alignment of gold). Additionally, bright field STEM imaging reveals a faint, larger "moiré of moiré" structure in cases where the bilayer molybdenum disulfide twist angle is small (∼6°), arising from the overlapping three-layers, which is not visible in conventional transmission electron microscopy images. Our experiments indicate that scanning transmission electron microscopy as a suitable tool for moiré analysis of twisted multilayer planar heterostructures, complementary to information provided by conventional transmission electron microscopy and diffraction.
本文展示了对封装在扭曲双层二硫化钼中的扭曲外延金纳米盘的莫尔条纹结构进行的原子尺度扫描透射电子显微镜（STEM）分析。高角度环形暗场STEM成像显示，金和二硫化钼之间莫尔条纹图案的周期随双层二硫化钼的不同扭曲角度而变化，范围从1.80纳米（金的外延排列）到1.53纳米（金的扭曲外延排列）。此外，明场STEM成像显示，在双层二硫化钼扭曲角度较小（约6°）的情况下，由于三层重叠会出现一个微弱的、更大的“莫尔条纹的莫尔条纹”结构，这在传统透射电子显微镜图像中是不可见的。我们的实验表明，扫描透射电子显微镜是用于扭曲多层平面异质结构莫尔条纹分析的合适工具，可补充传统透射电子显微镜和衍射提供的信息。
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