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细节决定成败:二维共价有机框架X射线粉末衍射数据分析中的陷阱与模糊之处

The Devil Is in the Details: Pitfalls and Ambiguities in the Analysis of X-ray Powder Diffraction Data of 2D Covalent Organic Frameworks.

作者信息

Van Gele Samuel, Bette Sebastian, Lotsch Bettina V

机构信息

Max Planck Institute for Solid State Research, Heisenbergstrasse 1, 70569 Stuttgart, Germany.

Department of Chemistry, Ludwig-Maximilians-Universität (LMU), Butenandtstrasse 5-13, 81377 Munich, Germany.

出版信息

JACS Au. 2024 Dec 23;5(1):388-398. doi: 10.1021/jacsau.4c00979. eCollection 2025 Jan 27.

Abstract

X-ray powder diffraction (XRPD) data of covalent organic frameworks (COFs) seem to be simple and apparently do not contain a lot of structural information, as these patterns usually do not show more than 3-5 distinguishable Bragg peaks. As COFs are inherently complex materials exhibiting a variety of disorder phenomena like stacking faults, layer curving, or disordered solvent molecules populating the pores, the interpretation of XRPD patterns is far from being trivial. Here we emphasize the critical need for precision and caution in XRPD data acquisition, refinement, and interpretation to avoid common pitfalls and overinterpretations in data analysis. This perspective serves as a comprehensive guide, educating the community on the nuances of refinement processes necessary for advancing COF research with clarity and accuracy.

摘要

共价有机框架(COF)的X射线粉末衍射(XRPD)数据看似简单,显然不包含大量结构信息,因为这些图谱通常显示的可区分布拉格峰不超过3 - 5个。由于COF本质上是复杂材料,表现出各种无序现象,如堆垛层错、层弯曲或填充孔的无序溶剂分子,XRPD图谱的解释绝非易事。在此,我们强调在XRPD数据采集、精修和解释过程中,精确性和谨慎性至关重要,以避免数据分析中常见的陷阱和过度解读。本观点作为一份全面指南,向学界介绍了清晰准确推进COF研究所需的精修过程的细微差别。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd42/11775697/cf26a4836800/au4c00979_0001.jpg

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