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利用高光谱成像数据早期检测小麦叶片上的感染情况。

Early detection of infection on wheat leaves using hyperspectral imaging data.

作者信息

Latchoumane Lorraine, Ecarnot Martin, Bendoula Ryad, Roger Jean-Michel, Mas-Garcia Silvia, Villesseche Heloïse, Tavernier Flora, Ryckewaert Maxime, Gorretta Nathalie, Roumet Pierre, Ballini Elsa

机构信息

AGAP, INRAE, Univ Montpellier, CIRAD, Institut Agro, Montpellier, France.

ITAP, INRAE, Institute Agro, University Montpellier, Montpellier, France.

出版信息

Data Brief. 2025 Feb 18;59:111404. doi: 10.1016/j.dib.2025.111404. eCollection 2025 Apr.

Abstract

This article presents a hyperspectral imaging (HSI) database of healthy leaves and leaves infected with fungal pathogen responsible for leaf blotch (Lb) disease. Leaves of two durum wheat genotypes were studied under controlled conditions to track the evolution of Lb disease and capture significant spectral and spatial differences until the onset of symptoms. Hyperspectral image acquisitions were purchased with two cameras in visible-near infrared (VNIR) and short-wave infrared (SWIR) spectral ranges on eighteen dates between one day before inoculation and twenty days after inoculation. For each wavelength range studied, a total of 1175 images provided information on 3326 leaves measured throughout the experiment. These data are valuable since they can be used as a basis to monitor disease's development over time, to build leaf classification models according to their infection status per genotype per day, to develop prediction models related to symptoms' appearance, or to test imaging and spectral analysis methods.

摘要

本文展示了一个高光谱成像(HSI)数据库,该数据库包含健康叶片以及感染了导致叶斑病(Lb)的真菌病原体的叶片。在可控条件下对两种硬粒小麦基因型的叶片进行了研究,以追踪叶斑病的发展情况,并捕捉在症状出现之前显著的光谱和空间差异。在接种前一天至接种后二十天的十八个日期,使用两台相机在可见-近红外(VNIR)和短波红外(SWIR)光谱范围内采集高光谱图像。对于所研究的每个波长范围,在整个实验过程中,总共1175张图像提供了关于3326片叶子的信息。这些数据很有价值,因为它们可作为监测疾病随时间发展的基础,根据每天每种基因型的感染状况建立叶片分类模型,开发与症状出现相关的预测模型,或测试成像和光谱分析方法。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/4385/11919375/e4370cf30e01/gr1.jpg

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