Salih Ethar Yahya, Eisa Mohamed Hassan, Mohammed Mustafa K A, Ramizy Asmiet, Aldaghri Osamah, Ismail Raid A, Ibnaouf Khalid Hassan
College of Energy and Environmental Sciences, Al-Karkh University of Science Baghdad 10081 Iraq
Department of Physics, College of Science, Imam Mohammad Ibn Saud Islamic University (IMSIU) Riyadh 13318 Saudi Arabia.
Nanoscale Adv. 2025 Jun 11;7(14):4461-4468. doi: 10.1039/d5na00331h. eCollection 2025 Jul 10.
This study elucidates a novel, fast-response, self-driven double-heterojunction (n-ZnO/p-ZnTe/n-Si) photodetector fabricated the rapid pulsed laser deposition (PLD) technique. The proposed geometry exhibits dual-responsive behavior under ultraviolet (375 nm) and visible (530 nm) incident wavelengths due to the heterojunctions (n-ZnO/p-ZnTe/Si and p-ZnTe/n-Si). Under a 0.5 bias condition, the former exhibited photo-responsivity ( ) and photo-detectivity (*) of 64.03 mA W and 5.19 × 10 Jones at 375 nm, while the latter demonstrated values of 53.20 mA W and 2.44 × 10 Jones at 530 nm, respectively; lower figure-of-merits were observed at higher and/or lower wavelengths. However, a higher applied bias contributes to a significant and * augmentation under these wavelengths. The observed characteristics were found to decrease at high incident light intensity, which suggests a negative correlation between the calculated parameters, with an value close to unity ( = -1). At zero applied bias, the proposed system demonstrated a stable performance over a period of 5 days with less than 1.5% variation. The response/recovery times for the proposed heterojunctions were 88/90 ms and 89/94 ms under 375 nm and 530 nm, respectively.
本研究阐述了一种采用快速脉冲激光沉积(PLD)技术制备的新型、快速响应、自驱动双异质结(n-ZnO/p-ZnTe/n-Si)光电探测器。由于异质结(n-ZnO/p-ZnTe/Si和p-ZnTe/n-Si)的存在,所提出的结构在紫外(375 nm)和可见光(530 nm)入射波长下表现出双响应行为。在0.5偏置条件下,前者在375 nm处的光响应度( )和光探测率()分别为64.03 mA W和5.19×10琼斯,而后者在530 nm处的值分别为53.20 mA W和2.44×10琼斯;在更高和/或更低波长下观察到较低的品质因数。然而,在这些波长下,更高的施加偏置会导致显著的 和增大。观察到的特性在高入射光强度下会降低,这表明计算参数之间存在负相关, 值接近1( = -1)。在零施加偏置下,所提出的系统在5天内表现出稳定的性能,变化小于1.5%。所提出的异质结在375 nm和530 nm下的响应/恢复时间分别为88/90 ms和89/94 ms。