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微晶电子衍射(MicroED)标准

Standards for MicroED.

作者信息

Unge Johan, Nannenga Brent L, Oliver Allen G, Gonen Tamir

机构信息

Department of Chemistry, Umeå University, 901 87 Umeå, Sweden.

Chemical Engineering, School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA.

出版信息

Acta Crystallogr C Struct Chem. 2025 Jul 1;81(Pt 7):376-390. doi: 10.1107/S2053229625004875. Epub 2025 Jun 20.

Abstract

As the electron diffraction technique MicroED gains momentum and is increasingly embraced by researchers in both academia and industry, we have the opportunity to familiarize ourselves with the characteristics of MicroED data and results. The number of refined structures and their associated data is steadily growing and becoming more accessible to the scientific community, offering valuable insights into the significance and quality of MicroED-derived structures. Additionally, the growing body of experience is helping to identify best practices for the technique. In this summary, we highlight key lessons learned from these data and propose gold standards for the community to consider adopting.

摘要

随着电子衍射技术微电子衍射(MicroED)不断发展并越来越受到学术界和工业界研究人员的青睐,我们有机会熟悉MicroED数据和结果的特征。精修结构及其相关数据的数量在稳步增长,科学界也越来越容易获取这些数据,这为深入了解MicroED衍生结构的重要性和质量提供了宝贵的见解。此外,不断积累的经验有助于确定该技术的最佳实践方法。在本综述中,我们重点介绍从这些数据中学到的关键经验教训,并提出供业界考虑采用的黄金标准。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/b0dc/12231505/e340a8e2280a/c-81-00376-fig1.jpg

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